Correlators
-
Product
DIgital 3D Image Correlation System
Q-400
-
The Digital 3D Image Correlation System Q-400 is an optical measuring device for true full-field, non-contact, three-dimensional measurement of shape, displacements and strains on components and structures made from almost any material.The Q-400 system is used for determination of three-dimensional material properties in tensile, torsion, bending or combined tests. In addition, deformation and strain analysis can be applied to fatigue tests, fracture mechanics, FEA validation, and much more.
-
Product
PXI-6280, 16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Hybrid, Multifunction I/O Module
779120-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Multifunction I/O Module—The PXI‑6280 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Single Shot Third-order Cross- Correlator
Rincon SS
-
Specifically developed for measuring a wide array of output parameters from ultrafast laser systems including: contrast ratio of laser pulses, determining pulse pedestal, pre- and post-pulses, and amplified spontaneous emission in femtosecond systems.
-
Product
Modulation Distortion Up To 13.5 GHz
S930701B
-
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
Product
PXI-6224, 32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Hybrid, Multifunction I/O Module
779114-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6224 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
PCI-6221, 16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device
779418-01
Multifunction I/O
16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
PCIe Gen3 Full HD, High Speed, Compact Camera for Testing
CB019CG-LX-X8G3
-
Full HD, High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
-
Product
Analyzer
Nexus8630
-
Highly evolved and automated correlation, pattern recognition, & analytics allow communication service providers visualize and exploit real-time insights about their service and application behaviour across individual interfaces or end-to-end connections
-
Product
Fibre Channel Test & Simulation Interface for PCI-X
PCI-X-FC4
-
Avionics Interface Technologies
Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent AnalyzerSupports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
-
Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
-
The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
-
Product
PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
-
4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
-
Product
PXI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module
779121-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXI‑6281 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Dielectric Loss Tangent and Transmission Attenuation Measurement System
RTS03
-
RTS03 measures relative permittivity (dielectric constant), dielectric loss tangent in the frequency range between 5GHz and 26.5GHz based on a correlation between measurement frequency and transmission attenuation as the microwave passes through the flat plane sample.
-
Product
Fibre Channel Test & Simulation Interface for PCI Express
PCIe-FC4
-
Avionics Interface Technologies
Half-size four lane PCIe board - Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speedsComprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent Analyzer - Supports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
-
Product
Active Monitoring or Synthetic Transactions
CloudReady
-
Always-on, end-to-end user experience monitoringNo complex scripting required, Exoprise maintains the actions the sensors takeMonitors app performance via both Web UI and API transactionsFull network path performance information for correlation and outage detection
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
PCI-6225, 80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device
779295-01
Multifunction I/O
80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI‑6225 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
-
Product
OpenSpace® OpsCenter™
-
Kratos Defense & Security Solutions, Inc.
- Unify management across ground station in single product- Monitor and control RF equipment, track health of IP networks and assure RF signal quality- Troubleshoot faster by correlating analytics across the ground- Integrate and automate operations with REST APIs- Store data in a common database using a unified structure
-
Product
PXI-6254, 32 AI (16-Bit, 1 MS/s), 48 DIO, PXI Multifunction I/O Module
779118-01
Multifunction I/O
The PXI-6254 offers analog input, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Modulation Distortion Up To 53 GHz
S95070B
-
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
-
Product
ENA-X Vector Network Analyzer
E5081A
Vector Network Analyzer
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
-
Product
PXI-6251, 16 AI (16-Bit, 1.25 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module
779117-01
Multifunction I/O
The PXI-6251 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Carbon Compound Instruments
-
Teledyne Advanced Pollution Instrumentation
Teledyne API's Carbon compound analyzers utilize Gas Filter Correlation combined with reliable NDIR (non-dispersed infrared) technology to produce very stable and accurate gas measurements. All T Series instruments offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support. All of our instruments are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
-
Product
LED Tester0.3m-2m Integrating Sphere
CX-8000
-
Shenzhen Chuangxin Instruments Co., Ltd.
Measure Luminous Flux, Luminous efficacy, radiant power, Spectral Power Distribution, Chromaticity Coordinate, Correlated Color Temperature, Peak Wavelength, Dominant Wavelength, Spectral Half Width, Color Rendering Index, Colorimetric Purity, red ratio, Standard deviation of color matching(SDCM), voltage, current, power, power factor, harmonics, and etc. It meets the requirements of CIE standards.
-
Product
Intel Atom® Processor-Based Ultra Compact Embedded Platform
MXE-200 Series
Embedded Platform
ADLINK's new Matrix MXE-200 series Ultra Compact Embedded Platform, based on the Intel Atom® SoC processor E3845/E3826, With superior-class construction meeting a wide variety of specific industrial needs, the MXE-200 series offers the most reliable Ultra Compact Embedded Platform for use in harsh environments, compliant with industrial grade EMI/EMS (EN61000-6-4,61000-6-2), protecting customer assets and reducing TCO. Opposing conventional correlations between size and computing power, the MXE-200 series features large-scale performance in an ultra-compact package.
-
Product
PCI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device
779068-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device - The PCI-6229 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
-
Product
Autocorrelators
-
Opticala Autocorrelators are devices for measuring the intensity or field autocorrelation function of light, mostly used for determining the pulse width of picosecond or femtosecond pulses, to which an electronic apparatus such as oscillascope would be too slow. The basic principle of operation of an autocorrelator for a pulse width measurement is to check the correlation of the temporal pulse trace with itself.
-
Product
PCI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO (2.8 MS/s), 24 DIO PCI Multifunction I/O Device
779109-01
Multifunction I/O
The PCI‑6281 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
