Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Regenerative Power System, 80 V, ±125 A, 5 KW, 200/208 VAC
RP7932A
The Keysight RP7932A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Quad 4x32 Reed Matrix for 34980A
34934A
The Keysight 34934A module for the 34980A Multifunction Switch/Measure Unit offers the highest density matrix for connecting paths between your device under test and your test equipment, allowing for multiple instrument connections to multiple points on your device under test at the same time.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780181-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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Scienlab Measurement And Control Module
SL1064B
The Measurement & Control Module SL1064B is a rack-mount gateway for CAN- and LIN-buses with up to 6 channels. It can be used as a configurable communication interface between Scienlab Battery Test Systems and devices under test (especially their BMS) as well as additional components using CAN communication.
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PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Automated Optical Inspection (AOI)
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Electromechanical Transfer Switches up to 40 GHz
Fairview Microwave’s line of electromechanical relay transfer switches can be utilized for numerous applications to increase system level capabilities and can help simplify the overall design approach. With two input and two output ports, transfer switches can connect two different instruments with two devices under test. Additionally, they can be used as drop-out switches, for signal reversal or to bypass a component under test. These products are typically used in military communications and broadcast systems, SATCOM, test & measurement, instrumentation applications and are suitable for aircraft use.
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PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Regenerative Power System, 160 V, ±125 A, 10 KW, 400/480 VAC
RP7946A
The Keysight RP7946A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Long Wavelength Optical Spectrum Analyzer 1200 To 2400 Nm And 1000 To 2500 Nm
AQ6375E
Due to the high resolution and sensitivity of the AQ6375E, it can actually detect the presence of water molecules in the air. The water vapor is detected in the upper Near-IR wavelength region and could overlap with or mask the spectral characteristics of the actual device under test in that particular region.
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Digital I/O Adapter Module For FlexRIO
Digital I/O Adapter Modules for FlexRIO offer up to 54 channels of configurable digital I/O that can interface with single‐ended, differential, and serial signals at a variety of voltage levels. When combined with a large, user‐programmable FPGA, you can use these modules to solve a variety of challenges, from high‐speed communication with a device under test to emulating custom protocols in real time.
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Large-size Hybrid Reverberation / Anechoic Chamber
F-Series
The F large-size hybrid Reverberation/Anechoic Chamber represents the most versatile OTA test system in the market today. With the same unique test features of their E Series RC counterparts, the F-Series can also test large form-factor devices under test (DUTs) like laptops, large TV sets, solar and trash compactors, drones, fridges or washing and vending machines, among others. With up to 16x16, 8DLCC and DUTs up to 2m and 500 kg including full-body phantoms in a turntable, the F Series also expands the frequency range down to cover 200 MHz up to 40 GHz frequency ranges and the test modes to include EMC, BS, small cell, eNodeB and Virtual Drive Testing over the air (VDT-OTA). In an again unheard-of feature, the F-Series is also reverse-convertible into an Anechoic chamber, allowing Far Field (FF) and Spherical Near Field (SNF) radiation patterns, efficiency and gain measurements and pre-5G testing of antennas and devices. Conversion from RC to AC or vice versa can be performed within half a day.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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PXI Single 36 Channel MUX, SMB Connectors
40-735-912-S4
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Digital Instruments
Digital Instruments generate and acquire high-speed digital waveforms for transmitting data, communicating with devices under test, or testing digital interfaces. These instruments are ideal for semiconductor characterization and production, interfacing to LVDS and TTL digital electronics, and testing the functionality of high-speed serial links.
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Test System
LB302
Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
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Test Probe
Beijing KeHuan Century EMC Technology Co,.LTD
Is a physical device used to connect electronic test equipment to a device under test (DUT).
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LCR Meters
PeakTech Prüf- und Messtechnik GmbH
A type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component.[1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably accurate if the capacitor or inductor device under test does not have a significant resistive component of impedance. More advanced designs measure true inductance or capacitance, as well as the equivalent series resistance of capacitors and the Q factor of inductive components.
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Nonlinear Component Characterization 10 MHz - 50 GHz (Export Control)
S94511B
The S94511B Nonlinear Component Characterization provides strong insight into the nonlinear behavior of your device under test (DUT).
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PXI Single 10 Channel MUX, XLR Connectors
40-735-902-S2
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Multiplexers
Capable of performing the necessary switching between test points of the device under test, to give access to low frequency measuring instruments, in electronic test systems based on tool receivers.
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Mobile Communications DC Sources (45 W, 100 W):
663xx Series
Use this family of specialized DC power sources to test your digital wireless appliances. All models offer DC sourcing, current sinking, fast transient response, GPIB, and measurement capabilities to help you with the unique challenges of simulating batteries and battery packs and measuring the current drawn by your device under test.
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Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
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Shock Testing
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Automatic Calibration Module
ACM4509
ACM4509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full four-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
782402-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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2kV, 80 MHz High Voltage Differential Probe
HVD3206A-6M
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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PXI Single 18 Channel MUX, BNC Connectors
40-735-902-S3
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
