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Product
Reflection Probes
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Reflection probes are used to obtain spectral information of diffuse or specular materials. The light from a light source is sent through six illumination fibers to the sample, and the reflection is measured by a 7th fiber in the center of the reflection probe tip. Discover our reflection probes below.
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Product
Probes, Clamp-On
EM-6987 | 1 KHz – 110 MHz
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The EM-6987 is capable of measuring signals and noise superimposed on power currents up to 300 A from DC to 400 Hz. Intermodulation effects on current probe output are also negligible.
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Product
Probes
72 Series
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American Probe & Technologies, Inc.
20 mil (0.020") shank sizesAvailable in straight and bent shapes to fit most industry standard analytical probe holders
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Product
High Voltage Passive Probes
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The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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Product
Board Test Fixture Probes
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Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Product
Raman Fiber Probes
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For ultimate flexibility, fiber-coupled Raman probes offer a compact design and a rugged, robust construction for a wide range of applications. With an optional integrated camera, the user can locate a precise region of interest prior to analysis. Also available are immersion probes and non-contact optics.
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Product
Differential Pressure Probes
PP473-S…
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Differential pressure probes complete with SICRAM module to measure pressure in the range 10, …, 2000 mbar.
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Product
Logic Analyzer Probes
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Three probe types are available for GoLogicXL logic analyzers: flying leadset, Mictor, and Pinpoint probes. The Mictor and Pinpoint probes are compatible with similar Keysight/Agilent "soft touch" and Tektronix "connectorless" probes. All GoLogicXL probes are coaxially shielded and use passive termination inputs to prevent loading the device under test. Both differential and single-ended input signals are supported by all probes. Input voltage swings small as 300 mV are supported in single-ended mode, and 150 mV for differential signals.
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Product
High Voltage Differential Probes
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High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.
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Product
Raman Probes
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As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
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Product
Energy Probes
RjP-400 Series
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The RkP-400 Series probes consist of a compact detector assembly, or head, and a preamplifier housed in a separate enclosure. The external dimensions of all the 400 Series Probes are the same, with identical detector planes, allowing for easy interchange of probes in an experiment. The heads have both ¼-20 and M6 tapped holes, a built-in 1" (25mm) filter holder, and a side-mounted BNC connector. Probe specific data, including spectral response curves and calibration dates, is stored in the preamplifier for access by the instruments.
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Product
P2663 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Gaussmeter Probes
2100
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Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range. Probe are supplied with flash memory and a temperature sensor that allow the 2100 Gaussmeter to correct for Hall Element inaccuracies due to temperature change. Probes are supplied with a NIST traceable Certificate of Calibration and test data.
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Product
BPLT-25 Long Travel Bead Probes
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cyles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Product
Test Leads and Probes
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Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
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Product
Renishaw Scanning Probes
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Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
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Product
Micro probes 1 MHz up to 1 GHz
MFA 02 set
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The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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Product
Spectroscopy Fiber Probes
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Spectroscopy probes for medical diagnostics and industrial process control, in volume production of fiber for medical and industrial lasers, for different fiber bundles, etc.
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Product
RF High Frequency Probes
High Frequency Probe
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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Product
CCA-006 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 78Full Travel (mm): 1.98Recommended Travel (mil): 40Recommended Travel (mm): 1.02Overall Length (mil): 669Overall Length (mm): 16.99
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Product
Fused Test Probes with Silicone Test Leads
AL-56FL
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Standard Electric Works Co., Ltd
Fused Test Probes with Silicone Test Leads
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Product
Probes, Magnetic Field
EM-6880 | 9 KHz – 520 KHz
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The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
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Product
Test Probes & Clips
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CF Instrument Accessories Ltd.
CF Instrument Accessories Ltd. Test Probes & Clips
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Product
Spring Probes
Spring Probe
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
Scanning Probes
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3D Laser Scanning Probes for your existing CMM are options for full-time or part-time use. Laser Design’s broad range of scanning probes ensures a perfect fit between the scanner and the size and detailed features of your parts.
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Product
Near Field Probes 30 MHz - 6 GHz
XF Family
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The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Product
Smart Probes
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A wide selection of rugged smart probes for your sensing needs. From non-contact IR sensors to a full range of sensor types including Temperature, Humidity, Process, RTD, Thermocouple, pulse, and mor...
