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Product
Probes Conductivity
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In-line sensors that measure a solution's ability to conduct electricity.
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Product
Hall probes
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Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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Product
Spring Contact Probes
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FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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Product
Probes
Type K
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No matter the application, ThermoWorks has a probe for you: penetration probes, immersion probes, air probes, surface probes, wire probes, even specialized probes like griddle probes, burger probes, pipe clamp probes, and probes for medical and lab use. Choose from standard tip, reduced tip, corkscrew tip, alligator clip, or needle probes; different handle types; and straight, coiled, stainless overbraid or even armored cables. Sensor types include type T or type K thermocouples, RTD sensors and our Pro-Series® line of thermistor probes.
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Product
T3CP Series AC/DC Current Probes
T3CP Series
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Teledyne Test Tools AC/DC Current Probes are powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range of five current probes includes models with bandwidths up to 100 MHz, peak currents up to 500A and sensitivities to 1 mA/div.
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Product
Jandel Four Point Probes
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Jandel probe heads are manufactured solely by Jandel Engineering Limited and there is one to fit all mountings and systems known to us.
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Product
High Impedance Active Probes
7
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Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Product
LED Probes for testing
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Advanced Probing Systems, Inc.
Probe Needles are used for the fabrication of most probe cards, however there exist applications for which these materials may not be appropriate, e.g., hubrid device and gold pad probing.
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Product
Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
Ultrasonic Single Element Probes
SONOSCAN P
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The ergonomic straight beam probes of the SONOSCAN Series for Nondestructive Testing (NDT) comply with the European Standard DIN EN 12668-2. Our ultrasonic transducers are used to check metals, plastics and ceramic materials for discontinuities, such as cracks, inclusions, blowholes and other material flaws.
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Product
SPM Probes
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AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal siliconOur well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpnessWe have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market
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Product
Near Field Probes 30 MHz up to 3 GHz
RF1 set
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The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Current Measurement Probes
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Comprehensive line of clamp-on current probes covers the entire spectrum of applications, from electrical panels to substations. AEMC Current Probes measure current without interrupting the circuit under test and extend the measuring capabilities of DMMs, recorders, power meters, and loggers. The numerous jaw sizes are designed to accommodate a wide variety of conductor diameters and ranges. Available for AC or DC measurements.
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Product
RF Coaxial Probes & Probe Positioner
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Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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Product
HPA-52 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
Current Probes
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PMI® introduces the convenience of flexible current probes (Flex CTs)! These 5,000A probes come in 12″, 24″, 36″, and 48″ lengths that allow you to easily surround multiple conductor bundles. They are available in sets of two, three, or four for use with different recorders. The Flex CTs are powered from recorder voltage and DO NOT require a battery pack for operation.
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Product
BTP-1 Bead Probes
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Probes
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SHOCONA Probes are designed for non-vibrating, contact mode applications and are compatible with most commercially available SPMs/AFMs. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging capabilities. This is a box of 10 probes.
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Product
Probes & OEM Modules
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Measure and monitor humidity, dew point, carbon dioxide, moisture in oil, temperature, pressure, and vaporized hydrogen peroxide.
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Product
Power Rail Probes
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Optimized for power integrity measurements, these probes combine low noise contribution, DC offset up to 60 V, high bandwidth, low loading, and a wide range of connectivity alternatives.
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Product
Low & High Voltage Differential Probes
T3
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Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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Product
P2247-1W General Purpose Probes
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 225Test Center (mm): 5.72Full Travel (mil): 300Full Travel (mm): 7.62Recommended Travel (mil): 200Recommended Travel (mm): 5.08Overall Length (mil): 1,145Overall Length (mm): 29.08
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Product
High Current / High Temperature Spring Probes
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We have spring probes, which can be used for high temperature and high current test under 200 degree and shows high performance in them.
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Product
Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-05
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
C-S General Purpose Probes
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 45Full Travel (mm): 1.14Recommended Travel (mil): 30Recommended Travel (mm): 0.76Overall Length (mil): 395Overall Length (mm): 10.03Rec. Mounting Hole Size (mil): 46.5Rec. Mounting Hole Size (mm): 1.18Recommended Drill Size: 56
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Product
Probes, Sensors, Measurement Microphones, Calibrators, Accessories
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Passive Probes, Active Probes, USB Isolators, Noise & Vibration Sensors & Accessories, Electro-Acoustic Test Accessories
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Product
Test Probes
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Safety right angle insulated alligator test probe, safety right angle insulated alligator test probe with insulated jaws, test probe, minitest probe, micro test probe.
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Product
Ultrasonic Probes
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The probe (transducer) frequency required will be determined by the minimum thickness of the material to be measured. However, the lower the frequency the more effective the ultrasound will be at penetrating corrosion and coatings, if applicable.
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Product
Test Probes and Pins
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Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
