Defect
other than specified, imperfection .
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Product
Portable GIS Partial Discharge Detector
JHPD-10
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Xiamen Jiahua Electrical Technology Co.,Ltd
JHPD-10 quickly and accurately detects various kinds of partial discharge signals that occur with insulation defects in GIS. Attached on the surface of GIS the detector collects the inside discharge signal of impure gas, suspension potential and solid insulation material. The diagnostic software analyzes the fault character and locates the fault to avoid electricity accident. The device is for daily patrol inspection with high efficiency and easy operation features. Designed with two UHF signal channels, one detects the partial discharge signal; another excludes the disturbance signal like corona discharge in the air and mobile phone communication.
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Product
Automated Optical Inspection System
AOI Series
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Perform visual inspections of printed circuit boards (PCB) during manufacturing in which a camera is used to scan the board in extremely fine detail to check for any defects or failures.
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Product
Surface Defect Inspection System
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Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
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Product
Bench PIM Testing
iBA Series
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Passive Intermodulation (PIM) occurs when multiple RF signals encounter defects in materials or workmanship in an RF path. These defects behave like a mixer causing noise to be generated at mathematical combinations of the original carrier frequencies. PIM interference that falls in the receive band of a wireless system elevates the noise floor resulting in high dropped call rates, call blocking, slow data transmission speeds and decreased system capacity. Kaelus is the industry leader in Passive Intermodulation test solutions. Since 1996 Kaelus has supplied RF equipment manufacturers around the world with precision IEC compliant test equipment to perform this critical test. From initial product design through high-volume manufacturing, Kaelus offers a wide range of PIM test solutions that enable equipment manufacturers to quickly and confidently verify the performance of their products.
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Product
PocketDetect HR
PocketDetect HR
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Hachmann Innovative Elektronik
With a PocketDetect HR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
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Product
High Performance Programmable AC Power Supply
IT-M7700 Series
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ITECH newly-launched IT-M7700 High Performance Programmable AC Power Supply combines intelligence and flexibility, breaks through the huge defects of the traditional AC power source, reduces the size to only 1⁄2 1U, maximizes space utilization. Built-in power meter and arbitrary waveform generator make it convenient to simulate various arbitrary waveform outputs. IT-M7700 is designed with advanced technologies of programmable AC and DC power supplies, and can be widely used in multiple fields such as power energy products, home appliances, industrial electronics, avionics, military and IEC standards testing.
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Product
Portable Eddy Current Flaw Detectors
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Portable eddy current (EC) flaw detectors inspect metallic parts and perform highly reliable and advanced flaw detection of surface and near-surface defects. Olympus offers portable eddy current equipment to meet a broad range of applications, including the detection of surface or near-surface defects, and the inspection of bolt holes.
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Product
Pipelines Testing Equipment
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A high voltage holiday detector is a quick and effective means of locating defects and faults in pipeline coatings (either enamel or tar wrap). As manufacturers of high-voltage test equipment; we have created 'Pipeline Test Kits' which provide all the necessary equipment to test for such defects.
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Product
Optical Test And Measurement
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Any type of fiber optic interconnection requires its interfaces to be free of dust and scratches in order to reach the lowest transmission loss. Small, handheld and battery powered inspection tools are available from AMS Technologies for inspection of fiber optic connectors in the field as well as high resolution type microscopes suitable for use in a production environment for qualifying the endface preparation. Additional S/W tools can support the user in making a quick decision if a certain defect is acceptable or if the surface fault disqualifies it for further use. Small and lightweight test equipment for measurement of the transmitted power in an optical fiber is needed wherever technicians handle optical fibers. Our product portfolio comprises light sources for various wavelengths, power meters for the visible and infrared and integrated solutions for sources and meters as well as optical time domain reflectometers (OTDR) coupled with visible wavelength light sources for easy fault detection within a fiber optic link.
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Product
Exploratory Testing
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Defects in apps and on websites directly impact customer conversions and retention. They exhaust user goodwill and ultimately damage your brand and revenues. Scripted or automated testing might indicate whether a particular customer journey works as intended, but will not necessarily reveal bugs beyond specific boundaries. They come to light only when the app or website is in front of real users.
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Product
Automatic Battery Testers
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T100BT is an innovative, modular battery testing equipment able to combine, on a single test platform, all the tests required to detect any possible defect on battery cells and modules: from defective cell wiring, to geometrical or surface irregularities, to out-of-specs performances.The battery tester is designed for the high-volume production test of battery modules composed by prismatic, cylindrical, or pouch cells, as well in a Lab/NPI version for engineering, prototypes and low-volume battery testing. The complete configurability allows you to equip the tester with the modules and tools you need to test your products, reaching the desired throughput.
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Product
Ultrasonic Flaw Detector
MFD660C
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MFD660C intelligent digital ultrasonic flaw detector, Mitech concentrated years meticulously developed premium product, has a lot of advantages like unique design, sophisticated manufacturing, convenient operation, powerful function. It had received customers' favored since its inception. It can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. With full digital 640X480 TFT LCD display, it can select the operating interface style and the LCD brightness according to environment. With humanizing interface design, the waveform show delicately. It can find the defects clearly in full screen. Single hand capable for holding operation, the curve making, probe calibration and other conventional operation can be completed automatically. Core processor CPU with 400M main frequency, it can complete the complex run quickly and realize intelligent defect analysis. Low power design with large capacity and high performance lithium ion battery module, it can work more than 10 hours continuously. Full English master-slave menu, emphasizing on user experience, collecting shortcut keys, digital shuttle rotary wheel, cross menu three operating ways in one body, customers with different habits can operate it freely. It supports many languages. Its waterproof, oil proof, dustproof function can achieve IP65 protection level. It is the necessary professional precision instrument for defect detection, quality control, on-line safety monitoring and life evaluation in fields of oil, chemical, metallurgy, shipbuilding, aviation, railways and so on.
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Product
Lightning Rod Flaw Detector
PADD
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We developed the PADD for the detection of internal and external partial discharges on metal oxide lightning rods. Defects can cause radio interference in communication systems or TV images, interference whose origin is very difficult to locate. We have developed a unique technology for detecting radio frequencies for use under voltage.
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Product
Thermalyze Extension for Steady State Analysis
Lock-In
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Steady-state thermography is limited to detecting hot spots that heat up a minimum of 100 mK (0.100°C). This may be useful for locating shorts on high-power devices, but is inadequate for detecting low power defects such as semiconductor device leakage current or short circuit with very low or very high resistance. Steady-state thermography also suffers from poor spatial resolution as the heat from localized hot spots diffuses rapidly, blurring the location of the heat source.
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Product
High Power Burn-In Test
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Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Product
Ultrasonic Imaging System
USPC 3010
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Detects internal defects in new materials and metals. The wide frequency range up to 35 MHz enables highestresolution. A-, C-, and D-scans can be recorded. The imaging in B-scans is an option.
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Product
Visual Control System of Label Printing Quality
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The created system allows detecting the following types of label printing defects:- absence or indistinct image or inconsistency of information applied by typographic method;- absence or indistinct image or inconsistency of information or going beyond the boundaries of the print field of variable information printed on the labeling machine (batch number, expiration date).The system is based on a Basler Scout A1300-32gc digital industrial camera and a panel computer.
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Product
Electronic Inspection Systems
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Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
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Product
Vision System With LGA1151 Socket 7th/6th Gen Intel® Core™ I7/i5/i3 & Celeron®, Intel® Q170, 4 PoE, 4 USB 3.0, And Real-time Vision I/O
IPS962-512-PoE
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The IPC962-512-PoE meets the increasing requirements for maximum quality and flexibility in modern production plants. It features flexible expansion capacity, camera communication interfaces, real-time vision-specific I/O with microsecond-scale and LED lighting control. This machine vision controller is powered by the LGA1151 socket 7th/6th generation Intel® Core™ (codename: Kaby Lake/Skylake) and Celeron® processors (up to 65W) with the Intel® Q170 chipset. The IPS962-512-PoE comes with a full range of isolated I/O interfaces and real-time controls essential to machine vision applications, including trigger input, LED lighting controller, camera trigger, as well as an encoder input for conveyor tracking. The real-time vision system PS962-512-PoE enables a fast and high accurate inspection to ensure that the desired quality is achieved with no manufacturing defects. It supports four IEEE802.3at PoE LAN ports and four USB 3.0 ports for connection with industrial cameras. Operating over a wide temperature range from -10°C to +55°C, the IPS962-512-PoE provides reliable and stable performance within severe environments. Its easy setup and compact design are ideal for space constrained environments. Moreover, one PCIe x16 and one PCIe x4 expansion slots allow quick installation of I/O cards and graphics cards. Two easy-swappable 2.5" HDDs are available for extensive storage needs.
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Product
WireChop
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A cost-effective, proven defect chopper system that works with both bench presses and automatic machines
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Product
Magnetic Permeability Meter Ferromaster
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Instrument for easy measurement of the relative magnetic permeability µr of feebly magnetic materials and workpieces with a permeability between 1.001 and 1.999. The permeability is measured by touching the workpiece with the probe tip and reading the result from the display. Typical applications are: non-destructive testing of materials, e. g. quality control of stainless steel, material selection for electron-/ion-beam equipment, detection of material defects induced by mechanical or thermal stress.
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Product
Surge Tester
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They are designed to detect quality defects in the insulation between winding turns, ensuring the reliability and performance of electrical components.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
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Identifies defect position instantly- contributes to saving inspection time
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Product
Welding Resistance Tester
WRT
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The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
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Product
FTIR Microscopes & Imaging Systems
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Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Product
X Ray Flaw Detector
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A non-destructive testing (NDT) device used to inspect materials for internal flaws or defects such as cracks, voids, inclusions, and weld discontinuities.
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Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Product
Open Source Service to Help Secure and Trust Your Software
Community Attestation Service / CAS
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- CAS stores all signatures inside of immudb, the standard for open source immutable databases.- CAS is protected against tampering. All attestation data is integrity-checked and cryptographically verified by the CAS client.- CAS is also protected against MITM attacks. The public key below is checked by every communication.A Software Bill of Materials (SBOM) is a list of components in a piece of software.Like a list of ingredients on food packaging -- where you might consult a label to avoid foods that may cause an allergy -- SBOMs can help companies avoid use of software that may harm their organization.If defects are later found in a specific part, the SBOM makes it easy to locate affected products.
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Product
Probing Machines
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Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.





























