Defect
other than specified, imperfection .
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Product
Metal InspectionSystems
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Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
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Product
Downward-Looking SUMO Source For Gallium And Indium
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Attain large capacity, excellent flux uniformity, negligible shutter flux transients, and minimal depletion effects with Veeco’s Downward-Looking SUMO® Source for MBE. It combines a dual filament source with an asymmetric SUMO crucible featuring a narrow offset orifice and tapered exit cone with hot-lip heating. Result: excellent material quality, low defect counts, and good thickness uniformity. NOTE: This source is not for use with aluminum.
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Product
Advanced Metrology System
NGS 3500L
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This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile processdevelopment system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.
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Product
Vison Inspection System
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High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Product
Plastic Analyzer
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The Plastic Analyzer method package includes an FTIR spectral library for plastics degraded by UV rays and heat. Utilizing searches of this library demonstrates its effectiveness in the analysis of unknown samples that are difficult to identify with standard libraries. Examples include plastics degraded by exposure to UV rays as well as contaminants and defective items altered by heating.
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Product
Power Steering Tester Kit
PST22A
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Pinpoints defective power steering pumps, defective power steering gears and kinked or clogged power steering lines.
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Product
Vacuum Discharge Test Equipment
DAC-VD-1
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DAC-VD-1 can locate defective points such as scars or pinholes on stator coils and wires easily.By applying voltage in a vacuum chamber, the electric arcing from a defective part can be discoveredvisually in a short time. DAC-VD-1 can be used widely in variety of applications from product developments to outgoing inspections.
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Product
Pre-reflow AOI
Zenith LiTE
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Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
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Product
Fully Automatic No Load ( Routine) Testing Panel For Self Priming Motors
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Aarohi Embedded Systems Pvt. Ltd
Aarohi introduced fully automatic routine testing panel. The primary purpose of the routine test is to insure freedom from electrical and mechanical defects, and to demonstrate by means of key tests the similarity of the motor to a “standard” motor of the same design. this panel also help to enhance productivity, Work efficiency & reduces need for skill operator.
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Product
Low Frequency Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Product
Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
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The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
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Product
High-speed In-Line 3D CT Inspection System
X-eye 6300
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Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Voltage Detector
PocketDetect LR
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Hachmann Innovative Elektronik
With a PocketDetect LR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working.
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Product
Partial Discharge Testing Equipment
AR700
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PD Defect Location in High-Voltage Equipment Insulation by Acoustic Sensors To act on deteriorating insulation the source of PD must be known.The insulation defects produce partial discharges, which emits electrical impulses, radiation of electromagnetic waves as well as acoustic signals.The AR700 measures acoustic signals with multiple sensors spread over the transformer. Then the software determines the failure location using the time difference of all incoming signals. Finally, these coordinates are shown in a 3D model of the transformer. AR700 device is used for measuring of acoustic signals on the external surfaces of gas-insulated breakers and substations, power transformers and other tank high-voltage equipment. The acoustic signals are caused by partial discharges in the insulation, which is the sigh of the defects.The advantage of “AR700” device is the quick installation of the acoustic PD sensors on the external surface of high-voltage equipment tank. The sensors have magnetic holder that is why there is no need to de-energize the equipment for the sensors installation. “AR700” device has 4 syn-chronic channels for acoustic signal measurement. This gives the possibility not only to find the defects in the insulation, but also to locate them. The location function of the “AR700”device is unique for acoustic devices.
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
X-ray Inspection System
X-eye SF160 Series
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High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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Product
Protection Device Testing
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The Motwane Manufacturing Company
Power system protection is a branch of electrical power engineering that focuses on protecting electrical power systems to detect and isolate faulty parts. The objective is to keep the power system stable by separating only the defective components while keeping the rest of the network in operation. The device protects the transmission lines, generator transformer, and other electrical apparatus from multiple faults.
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Product
Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Product
Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Product
Code Verification Systems for Quality Inspection
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Matrix codes enable the comprehensive and seamless traceability of goods, which turns out as significant advantage considering everyday product recalls across all industries. Whether salmonella in food, contaminated cosmetics or poor components: defective products can harm consumers, cause losses of image as well as massive economic losses. Using the 2D code, each individual article can be localized globally. Based on the specific serial number, producers and consumers can clearly identify articles if required. That represents a perfect tool for determining whether the article is subject to be withdrawn from circulation. The proper application and specification of 2D code contents allows for serious and sustainable companies to limit recalls, save costs, and to take responsibility for consumer protection.
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Product
Automated Stand for Magnetic Luminescent Control of Railway Wheels
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The amount of information processed and time constraints required the creation of a multi-level distributed image processing system based on National Instruments Compact Vision System controllers, industrial computers and workstations. During the control process, the wheel is watered with a magnetic-luminescent emulsion, magnetized and exposed to ultraviolet radiation. As a result, the emulsion deposited on the defects glows in the visible range (yellow-green light). Eleven FireWire (IEEE 1394) color cameras with a resolution of 1280 x 1024 are used to scan the wheel surface. In one iteration, they completely cover a 20-degree sector of the wheel.
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Product
Optical Test And Measurement
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Any type of fiber optic interconnection requires its interfaces to be free of dust and scratches in order to reach the lowest transmission loss. Small, handheld and battery powered inspection tools are available from AMS Technologies for inspection of fiber optic connectors in the field as well as high resolution type microscopes suitable for use in a production environment for qualifying the endface preparation. Additional S/W tools can support the user in making a quick decision if a certain defect is acceptable or if the surface fault disqualifies it for further use. Small and lightweight test equipment for measurement of the transmitted power in an optical fiber is needed wherever technicians handle optical fibers. Our product portfolio comprises light sources for various wavelengths, power meters for the visible and infrared and integrated solutions for sources and meters as well as optical time domain reflectometers (OTDR) coupled with visible wavelength light sources for easy fault detection within a fiber optic link.
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Electrical Components Testing
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To be successful on the market, the safety, quality, durability, and reliability of your products are essential.Manufacturers are responsible for ensuring that the products they place on the market meet all relevant regulations. Ensuring that your customers receive safe components of high quality is critical to the longevity of your business.Every part of an electrical appliance can be hazardous and one defective component can lead to disastrous results. Our experience and scope of accreditations help you to meet local and global electrical product safety regulations. As one of the largest certifiers within the CB Scheme TÜV Rheinland Group has vast experience in a broad range of product testing.
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Product
Surface Paint Quality Scanner
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Konica Minolta Sensing Americas, Inc
There is always a challenge to achieve a consistent high quality surface on a car body during production. The goal of the manufactures is to reduce defects and, quickly and accurately fix the ones that occur.
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Product
Full 3D Inline Metrological & Imaging AOI
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Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
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Product
Ultrasonic Concrete Testing
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This category comprises the range of instruments that use sound or stress waves in order to determine the properties of concrete and other materials non-destructively. The first and most widely used System is our V-Meter, which utilizes the ultrasonic pulse velocity method for evaluating construction materials in the field. Transducers are available for a variety of frequencies from 24 KHz to 500 KHz. This unit has also been modified to suit the special needs of ceramics users and can be found as the Ultrapulse. The PIES, our revolutionary Portable Impact-Echo System, is an advanced instrument for non-destructive detection of flaws and defects in a variety of civil infrastructures ranging from bridges, parking structures and buildings to dams, piles, tunnels, tanks and marine structures.
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Security Testing Services
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You're building more-complex software faster than ever before, but does your team have sufficient application security skills and resources to test it for security defects? Synopsys security testing services provide continuous access to security testing experts with the skills, tools, and discipline needed to cost-effectively analyze any application, at any depth, at any time.
