Defect
other than specified, imperfection .
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Product
TEST SOCKET
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IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Product
Thermal Shock Chambers
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Weiss Technik Thermal Shock chambers are designed to give quick transitions between a HOT and COLD temperature zones. Available in vertical, horizontal and liquid models. Thermal stock chambers are used in all industries including Automotive, Electronics, Aerospace, and others to help find product defects in electronic components and product assemblies. Thermal shock is important with MIL -STD 883 test standard.
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Product
Holiday Detector
VHD
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Veer Electronics Make Holiday Detector is Capable to Detect Any Pinhole or Defects .In Anticorrosive Coating on Metallic Pipes/Surfaces. The Pipe is connected to Earth and Electrode Charged to High Tension is moved over Coating. If Any Pinhole or Defective Point is detected on Coating High Voltage Spark Occurs on Pipe or Surface of Testing. At the Same time Electronic Buzzer also gives Audio Indication and Fault LED glows as Visual Indication of Fault.
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Product
Wafer & Die Inspection
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SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
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Product
Companion Tool to VS for Test Time & Pin reduction
UltraScan
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UltraScan is SynTest's solution to combat increase in test time. In 130 nm or smaller ? nanometer geometries, many defects become delay defects and it becomes necessary to use delay tests to detect the transition faults and path delay faults. Often bridging tests are also required.
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Product
Inspection System
X-eye 7000B
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Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Product
Intelligent Cable Fault Locator
TM800
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TM800 Cable Fault Locator is a portable field instrument working on TDR and bridge methods, adopting advanced micro-electronics technology. It is designed to locate accurate fault points in such cables as telecommunication leadsheathed cable, plastic cable or user’s lead covered wire, while the faults include break, mix, earthing, defective insulation, or poor connecting. It is and ideal function-stable instrument for the field operator to improve work efficiency, in addition, it can also be used for circuitry project checking electric property testing of the cable.
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Product
Mini Visual Laser Source
TM536 Series
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TM536 Series Mini Visual Laser Source totally complies with the human engineering. It's small in size, easy to operate, portable and integrated with a launching indicator. A Visual Laser Source is usually used to inspect the damaged or broken point of a optical fiber, cable, patchcord and etc.If the inspected fiber does have a defect, user could find the visual laser at the broken or damaged point. TM536 Series Mini Visual Laser Source is suitable for both single mode and multimode fibers. The performance of the visual laser source will act a little different on different fiber coat and color.
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Product
Infrared Microscope
DDR200 & DDR300
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The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
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Product
Semiconductor
DieMark
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DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
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Product
AutoGet auto Focus Portable Fiber Endface Inspector
CA3008
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CA3008 Autoget is an intelligent portable fiber enface inspector. with newest hardware and software, and with functions of auto focus, auto exposure,auto analysis, autogenerate report, auto image transmission, etc. Autoget can clearly find out the defects of fiber endface, such dirts, scratches.
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Product
RFID Label Inspection System
Eurotech RFID FS
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The Eurotech RFID FS RFID accurately rewinds rolls of RFID labels and validates their receptivity by running them through the Voyantic Tagsurance RFID inspection system. The unit allows stopping at a predetermined editing spot for the removal and replacement of the defective piece, as well as indicating defective labels by a mark printed by an inkjet system integrated with the machine. Adjustment of the closed loop tension control system can be made through adjusting the parameters on the software that control the servo motor control system. This gives the customer a virtual infinite range with which to wind their labels without cracking the inlay or antenna. As well accurate web adjustment and guidance is provided with a web guide system complete with an ultrasonic sensor. The Eurotech RFID FS RFID label inspection system is equipped with the Voyantic Tagsurance for testing the performance of RFID tags. This is done by verifying that the tag responds to commands on its whole operational frequency range, which means testing the tag on multiple frequencies, also outside the RFID reader frequency. Accurate power output combined with the Voyantic Snoop Pro antenna, optimized for testing tags inline at high speed, allows defining precise acceptance criteria and achieving stable quality.
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Product
Tool and Process Monitoring
BK MIKRO
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BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
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Product
Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Product
PXI Based Multifunction Measurement and ICT Instrument
PXI-501
Multifunction Switch/Measure Unit
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Product
Security Testing Services
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You're building more-complex software faster than ever before, but does your team have sufficient application security skills and resources to test it for security defects? Synopsys security testing services provide continuous access to security testing experts with the skills, tools, and discipline needed to cost-effectively analyze any application, at any depth, at any time.
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Product
Environmental Stress Screening (ESS) Chamber
ESS
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Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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Product
Reject Station for X-Ray Image Analyser
IV-110I
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IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
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Product
High-Accuracy Automated Optical Inspection Systems
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Fully-automated and high-accuracy 3D inspection and measurement systems. High-power, long working distance optics and high-resolution digital camera are perfect for high-magnification applications. These are full-color systems capable of high-accuracy measurements, automated defect detection and color verification.
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Product
Ultrasonic Flaw Detector
MFD500B
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Based on ultrasonic principle, digital ultrasonic flaw detector MFD500B with 320*240 TFT LCD, it can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. It can be used in Laboratory as well as in engineering filed. With range of 0-9999mm, it can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium battery module, it can be long standby for months. High quality with low price, it is the first choice for the practical economic model for ultrasonic testing equipment.
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Product
X-ray Inspection Performance
MXI Quadra 7
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Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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Product
Non-contact Ultrasonic Testing System
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Yamaha Fine Technologies Co., Ltd.
Contact-free inspection through ultrasonic transmission detecting air bubbles, separation, and foreign materials inside workpieces. With a Yamaha ultrasonic amplifier installed, contact-less inspection in the air is realized. Without damaging or wetting the workpiece, it is possible to inspect the workpiece for packing defects, air bubbles, and even flaw depth.
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Product
Winding Resistance Tester
JYR20S/10S
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DC winding resistance testing is regarded as another essential routine screening tool. It indicates problems such as loose, defective or incorrect connections, which cause enough transformer failures each year to be regarded as a failure category of its own.
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Product
Data Analytics
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KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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Product
Particle Impact Detection System 10
BW-LPD-DAQ4000HD
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This system is capable of vibration testing up to 10 pounds and detecting defects that produce noise, such as loose screws, particles, etc. Right from the start of PIND testing, B&W patented the first MIL-STD compliant system outperforming the competition by over 30% better detection rate as tested by the NBS (now National Institute of Science and Technology) in a well known 1978 study (NBSIR 78-1590 NASA).
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Product
G3 System
Dragonfly
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Unique 2D imaging technology provides fast, reliable inspection for sub-micron defects to meet today's R&D needs and tomorrow's production demands. Onto Innovation's patented Truebump® Technology combines multiple 3D metrology techniques to deliver accurate 100% bump height metrology and coplanarity.
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Product
Defect Inspection Module
EB40
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The Class 1 certified E40 and B40 modules (available separately or combined in one module) can automatically detect defects on the entire edge, from zone 1 to 5, and the entire backside. The ability to inspect the entire backside allows for faster root-cause analysis of zone 5 defects since such defects can migrate from the wafer interior.
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Product
DC Magnetic Flux Leakage Testing
ROTOMAT / TRANSOMAT Product Family
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Foerster Instruments, Incorporated
With the new generation ROTOMAT DA and TRANSOMAT DA flux leakage test systems FOERSTER is setting new standards in continuous quality assurance of ferromagnetic steel tubes. The test systems enable the reliable detection of natural and oblique defects, regardless of their angle or length, in addition to standardized longitudinal and transversal defects. The miniaturization of sensors together with highly integrated electronic components dramatically increases the number of channels. This makes a more precise and finer scan of the surface possible, giving a more complete set of information regarding detected defects. The newly introduced C-Scan visualizes these defects in high-definition and real-time, resulting in a completely new evaluation of the tubes to meet rising quality requirements.
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Product
Battery Boxes Testing Equipment
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Battery boxes can be tested for faults by placing the box on a metal plate. By applying a test voltage to an electrode inside the box, the moulding can be checked thoroughly - particularly at the injection points - and any faults found. Defects will be identified by a spark passing from the electrode, through the defect itself, to earth (the conductive material placed outside the battery box.
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Product
Machine Vision System for Magnetic Luminescent Control of Wheels
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The machine vision system of the wheel magnetoluminescent control unit is designed to automate the technological operation of the magnetic luminescent control in the production of railway wheels with full-profile mechanical surface treatment. The system is a hardware and software complex for presenting complete information on the tested wheel to a flaw detector operator, automatic detection of potential defects, maintaining a control protocol and interacting with the installation controller and the line database.
