Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
LOADED BOARD TEST PROBES
SERIES-70
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ElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35mA test current70 18 mOhms mean73 60 mOhms mean74 40 mOhms meanMaterials and FinishesPLUNGER: Heat treated beryllium copperor steel hardened to 55-60RC70 24Kt gold plated over nickel73 24Kt gold plated over nickel74 Rhodium plated over nickelBARREL: Nickel silver70 24Kt gold plated ID and OD over nickel73 No Finish74 24Kt gold plated ID and OD over nickel
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Product
Retractable Cable With Magnet Adsorption
3701
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Peaceful Thriving Enterprise Co Ltd
*2 x 6m retractable test leads.*Used as an extension cord for cars, trailers, boats and more.*Optional accessory included alligator clips, test probes and banana plugs.*The tester can be used with any multi meter or device equipped with banana jack connectors.*Embedd A Magnet on the back to fix on suitable metal sheet of cars easily.
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Product
Advanced High Speed Test Probe
SQprobe
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SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.
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Product
Fault Injection and White-Box Testing
VectorCAST/Probe
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VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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Product
Stand-Alone Test Fixture
MA 2012/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 15,50 kg
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Product
Fixture Building Software
FixGenius
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Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Product
Test Contactor/Probe Head
Mercury
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Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.
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Product
ICT Probes
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ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Kid's Finger Test Probe 19
CX-19
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Shenzhen Chuangxin Instruments Co., Ltd.
Children Finger Test Probe 19 is intended to simulate access to hazardous parts by children of 36 months or less.
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Product
IPTV Testing Probe
H & M-Probe
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*Stand alone low bandwidth IPTV monitoring probe*Rugged packaging and industrial reliability*Web based appliance generates automatically service quality alarms*Provides basic metrics for quality of MPEG2 TS video transport*Stores alarm history and provides graphical histograms*Accepts streams bandwidth
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Product
FEA and Strain Gauge Testing
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Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Product
Eddy-Current Sensors
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Eddy-Current sensors are noncontact devices capable of high-resolution measurement of the position and/or change of position of any conductive target. Eddy-Current sensors are also called inductive sensors, but generally "eddy current" refers to precision displacement instruments (or nondestructive testing probes) and "inductive" refers to inexpensive proximity switches. High resolution and tolerance of dirty environments make eddy-current sensors indispensable in today's modern industrial operations.
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Product
Non-Contact Voltage Testers
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PeakTech Prüf- und Messtechnik GmbH
User-friendly tester for non-contact voltage testing from 50 V to 1000 V AC. Suitable for outlets, lamp sockets or against wire insulation testing. If AC voltage is present at the relevant measuring point, this is indicated visually by a flashing red LED and the integrated buzzer sounds. If the measuring point is voltage-free, the test probe lights up permanently green.
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2D
General Purpose Probe
Current Rating (Amps): 5Average Probe Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64Resistance (mOhm): 35
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Product
Single Function Installation Testers
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A handheld insulation resistance and continuity tester. Its unique integrated safety probe puts the LCD and test probe in the user's line of sight whilst making measurements.
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Product
Spring Contact Probes
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Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Deluxe DMM w/Amp Shutters
582
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*Huge 2 inch LCD Display, easy to see from across the room *Display is backlit for use in Dark Spaces *Amp Shutters prevent mistaken operation, improve safety and saves fuses by blocking unused amp jacks! *Great Meter for Electrical Trouble Shooting *11 Test Functions, 33 Test Ranges *Measures Temp in Both F and C, Probe Included *Desireable 20 Amp Test Range *Modern Design, the Protective Holster is Built-In *Data Hold *Carrying case, Test leads, Temp probe, Instructions and Battery included
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Product
High Frequency (RF) Testing
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C.C.P. Contact Probes Co., LTD.
CCP designs high frequency testing probes, coaxial probe sockets and pressurized conductive rubber sockets.
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Product
Universal Manipulator
LS
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Manage the rapidly changing production environment and achieve the lowest cost of test, converting between probe, final, engineering and service positions with ease. Rapid advancements in semiconductor test technology have resulted in highly efficient test cells, capable of device test throughputs far greater than ever before.
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Product
Test Probe Connector, High Voltage, Voltage, 3 %
72-6530
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The 72-6530 is a high voltage Testy Probe with built-in meter measures voltages up to 40kVDC.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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Product
CAMGATE Test Kits
Series 457
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The VP Series 457 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 457 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those preferring to provide their own ITA Interface. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Product
Stand-Alone Test Fixture
MA 2013/D/H/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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RF Test Probes
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With over 50 Tip-Styles, you can be certain we can help you find the right solution for your testing demands. And if we don’t offer a probe solution already in production, we will work together with you to develop a custom solution.
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Product
IC Test Probes
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C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
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Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Product
Auto-Ranging Digital Clamp Meter
DCM401
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Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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Product
Test Contactor/Probe Head
xWave
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Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Product
Battery Probes
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C.C.P. Contact Probes Co., LTD.
CCP offers a variety of different high current battery testing probes.
