Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Test Probes and Pins
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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Auto-ranging Digital Clamp Meter
DCM402
Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off, linear bar graph functions and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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IEC61032 Test Probe Pin
CX-112
Shenzhen Chuangxin Instruments Co., Ltd.
1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.
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Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2D
Current Rating (Amps): 5Average Probe Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64Resistance (mOhm): 35
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Test Probes
Safety right angle insulated alligator test probe, safety right angle insulated alligator test probe with insulated jaws, test probe, minitest probe, micro test probe.
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6 Sided Bed of Nails Testers
BoxProber Family
6 sided Bed of Nails circuit board test fixture. Probes top bottom and all 4 sides. Central camming mechanism pull plates inward. Mechanically or electrically actuated options. Designed primarily for testing products in plastics. Side access electrically probes outside panel connectors. The unit will also optically read LEDs and key segments off LCD displays. Solenoids will press buttons and servos will turn selector switches. DC motors are used to adjust multiple turn potentiometers. Microphone will detect audio output tones. Top and bottom of circuit boards can also be probed if removable access panels are available. This unit will also probe all 6 sides of a circuit board. This is typically utilized in applications where connector testing is required.
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CAM/TRAC Test Kits
Series 43
The GR Series 43 CAM/TRAC®1 kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 43 provides interface compatibility by using a 12 position, GR2270 style I/O block interface. This interface accepts the industry standard I/O, power, and coax blocks.
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Test Probe Connector, High Voltage, Voltage, 3 %
72-6530
The 72-6530 is a high voltage Testy Probe with built-in meter measures voltages up to 40kVDC.
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Test Finger Probe
Shenzhen Bonad Instrument Co., Ltd.
BONAD’s test fingers, test probes and test needles comply with IEC 60065, IEC 60238, IEC 60335, IEC 60529 and IEC 61032 standards and are essential instruments for the protection against electric shock of household and similar electrical appliances. For more information, please contact us and BONAD will provide you with professional technical advice and high-quality testing equipment.
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IEC61032 Test Probe 32
CX-32
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 32 is intended to verify the protection provided by fan guards against access to hazardous mechanical parts.
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Test Hook Probe
CX-S11
Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Used on enclosures prior to accessibility testing. The test hook is ¨hooked〃 into vents and seams in the enclosure & then pulled with a force (usually 20N).
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Mini Back Probes/Wire Piercers
618
*Great for backprobing weather pack style connectors used with numerous automotive sensors *Also very handy for piercing and tapping readings on smaller gauge wires - using the included probe adapters *Works with most Test Lead Kits in the field - with standard 4mm banana plug test lead *Set includes four probes - red, black, green, yellow Test probes 21 mm length
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DMM Test Probe Kit With Multi-Stacking Banana Plug
5325A
DMM test probe kit with multi-stacking banana plug
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Mini-Link™ Miniature Jumper
Series ML-100
Mini-Link Miniature Jumpers. Used to jumper from row-to-row or from pin-to-pin. Their miniature size makes it possible to stack one on top of the other. A convenient test probe slot is provided as well. Mini-Links are available from the factory with or without a handle, used for ease of inserting or extracting.
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30 AMP Fuse Buddy Testers
FB305M
Can test circuit current up to 30 Amps - an easy way to check fuel pump amperage. Clever design allows for easy connection into fuse sockets. Fuse Buddy ends are molded into the shape of the fuse itself. During testing the fuse is removed and replaced into the Fuse Buddy. This way, the circuit being tested maintains fuse protection. Fuse Buddy stays put & won't fall out of the socket, like test probes do.
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Test Probes
A physical device used to connect electronic test equipment to a device under test (DUT).
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Test Contactor/Probe Head
Mercury
Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.
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Fault Injection and White-Box Testing
VectorCAST/Probe
VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.
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IPTV Testing Probe
H & M-Probe
*Stand alone low bandwidth IPTV monitoring probe*Rugged packaging and industrial reliability*Web based appliance generates automatically service quality alarms*Provides basic metrics for quality of MPEG2 TS video transport*Stores alarm history and provides graphical histograms*Accepts streams bandwidth
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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Kid's Finger Test Probe 19
CX-19
Shenzhen Chuangxin Instruments Co., Ltd.
Children Finger Test Probe 19 is intended to simulate access to hazardous parts by children of 36 months or less.
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Fixture Building Software
FixGenius
Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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THRU HOLE BARE AND LOADED BOARD TEST PROBES
SERIES 93
ElectricalMAXIMUM CURRENT: 7 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current,35 mOHMS mean
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Short Test Pin Probe 13
CX-13
Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards.
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Products for High-Frequency Measurement
This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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IEC60335 Nail Test Probe
CX-Z12
Shenzhen Chuangxin Instruments Co., Ltd.
The Finger Nail Probe is indicated to test IEC 60335 and UL requirements. Used to check the security of parts that snap together. The spring gauge assembled in the handle can be calibrated to the necessary force for using the instrument. This probe is made of stainless steel with appropriated hardened tip and a handle in insulating material. Handle has a special adaptor M5 for use with 50N force gauges.
