Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
Single Ended Test Probes
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Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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Product
Auto-ranging Digital Clamp Meter
DCM402
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Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off, linear bar graph functions and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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Product
Stand-Alone Test Fixture
MA 2013/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 22,00 kg
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Product
Environmental Test Probe, Temperature
72-8364
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Type K Surface Temperature Probe Surface probe is ideal for flat stationary surfaces such as molds, heating elements, integrated circuits, transistors and transformers. Very low sensor element mass enables fast response measurement time. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs. See the complete line of Tenma Thermocouple Probes and Accessories
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Product
Digital Engine Analyzer/Multimeter
385A
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The #385A has many of the necessary features required for today’s automotive diagnostics. Use frequency readings to test crankshaft and camshaft sensors, for example. The #385A comes equipped with an RPM pick-up, probe test leads, alligator clip test leads, protective holster, instructions and installed 9V battery. Inductive RPM pick-up features a five position, adjustable sensitivity switch.
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Product
MPI SiPH Probe Systems
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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Product
Benchtop with Drop-In Test System
600 Series Compact ATE Platform
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The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
Gaussmeter
DX-105
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DX-105 Gaussmeter is a desktop gaussmeter. Which is based on the latest progress of the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probe adapts imported GaAs linear Hall-chip, the difference between any two probes is small, which can be replaced directly when it is damaged. DX-105 Gaussmeter is an ideal DC magnetic field test instrument.
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Product
Rugged Connectors
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Guaranteed for a minimum of 100,000 connections, our rugged connectors are designed to meet your industrial & ergonomic demands in harsh testing environments. We offer numerous connector specifications all fitted with interchangeable spring loaded test probes. Supplied as a single hand held unit, panel mounted or fitted to a test lead, the combinations are limitless. Designed directly from your CAD data and thoroughly tested, our rugged & reliable connectors are used worldwide on a daily basis.
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Product
Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
External Controller
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
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Product
Heat Test Probe 43
CX-43
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Shenzhen Chuangxin Instruments Co., Ltd.
It's the necessary tool to proceed protecting electric shock test of household and similar electrical appliances.
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Product
Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Product
Test Contactor/Probe HEad
cRacer
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The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Product
Environmental Test Probe, Temperature
72-8366
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Simple thermocouple junction at the end of a 1m wire provides effective low cost ambient temperature measurement. It is suitable for measuring air temperature and may be placed in direct contact with hard surfaces. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs.
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Product
MANIA TEST PROBE
SERIES 76
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ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Test Service Offerings
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Product
Test Hook Probe
CX-17
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Hook Probe Test Hook Probe is strickly designed according to IEC60065.
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Product
IEC60335 Test Probe 11
CX-11
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 11 This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult.
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Product
Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
Test Switches and Accessories
FT Flexitest Family
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The ABB FT test kit comes with a convenient carrying case to hold your hand held meter, test plugs patch cords, clips, and test probes in neat order. Patch cords are highly durable and flexible. Test switch accessories include: Test plugs Test kits Covers Interlocking bars Miscellaneous
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Product
Test Finger Probe
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Shenzhen Bonad Instrument Co., Ltd.
BONAD’s test fingers, test probes and test needles comply with IEC 60065, IEC 60238, IEC 60335, IEC 60529 and IEC 61032 standards and are essential instruments for the protection against electric shock of household and similar electrical appliances. For more information, please contact us and BONAD will provide you with professional technical advice and high-quality testing equipment.
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Probe Cards
Direct Dock
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Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Product
Probe And Test Adaptors Set (13PCS)
3601B
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Peaceful Thriving Enterprise Co Ltd
1. Extra thin test probe.2. Flexible silicone cable.3. For use in conjunction with test probe.4. Bi-color test leads for polarity indication.5. High quality testing and test accessories.
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Product
6 Sided Bed of Nails Testers
BoxProber Family
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6 sided Bed of Nails circuit board test fixture. Probes top bottom and all 4 sides. Central camming mechanism pull plates inward. Mechanically or electrically actuated options. Designed primarily for testing products in plastics. Side access electrically probes outside panel connectors. The unit will also optically read LEDs and key segments off LCD displays. Solenoids will press buttons and servos will turn selector switches. DC motors are used to adjust multiple turn potentiometers. Microphone will detect audio output tones. Top and bottom of circuit boards can also be probed if removable access panels are available. This unit will also probe all 6 sides of a circuit board. This is typically utilized in applications where connector testing is required.
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Product
CAPACITANCE METER
C350
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This is a high quality digital capacitance meter. Check the accuracy and status of capacitors up to 20mF, a very handy tool for virtually any technician. It features high accuracy (0.5%) and 9 selectable ranges. A zero adjustment knob is also provided to "zero" test lead capacitance. Includes test probe set and yellow rubber boot.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Product
Mini-Link™ Miniature Jumper
Series ML-100
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Mini-Link Miniature Jumpers. Used to jumper from row-to-row or from pin-to-pin. Their miniature size makes it possible to stack one on top of the other. A convenient test probe slot is provided as well. Mini-Links are available from the factory with or without a handle, used for ease of inserting or extracting.
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Product
Fingernail Test Probe
CX-Z11
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Shenzhen Chuangxin Instruments Co., Ltd.
The Fingernail Test Probe is used to test to IEC 60335 and UL standards. It checks the security of parts that snap together. The spring loading in the handle can be calibrated to the force necessary to use the instrument. This probe is made of stainless steel with specially hardened tip and a Delrin?handle. Handle has a threaded hole for use with force gauges.
