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Product
2-Ch 500 MHz A/D with DDC & 2-Ch 800 MHz D/A with DUC, Kintex UltraScale - XMC
Model 71851
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- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Supports Xilinx Kintex Ultrascale FPGAs- Supports VITA-49.2 VITA Radio Transport standard- Two 500 MHz 12-bit A/Ds- Two multiband DDCs (digital downconverters)- One DUC (digital upconverter)- Two 800 MHz 16-bit D/As- 5 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multimodule synchronization- PCI Express (Gen. 1, 2 & 3) interface up to x8- VITA 42.0 XMC compatible with switched fabric interfaces- Optional LVDS and gigabit serial connections to the Kintex - Ultrascale FPGA for custom I/O- Optional 400 MHz 14-bit A/Ds- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Product
UV-NIL / SmartNIL® Systems
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EV Group provides a complete product line for UV-based nanoimprint lithography (UV-NIL), including different single-step imprinting systems, large-area imprinters as well as step-and-repeat systems for efficient master fabrication. Besides soft UV-NIL, EVG offers its proprietary SmartNIL technology with multiple-use polymer stamp technology. The efficient and robust SmartNIL process provides high pattern fidelity, highly uniform patterned layers and minimum residual layers, combined with easy scalability in wafer size and production volume. EVG´s SmartNIL redeems the long-term promise of nanoimprinting being a high-performance, low-cost and volume-capable manufacturing technology for mass production of micro- and nanoscale structures.
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Product
Spray Rating Tester
TF160
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TESTEX Testing Equipment Systems Ltd.
Spray Rating Tester, to determine the surface wetting resistance of fabrics, which may or may not have been given a water-resistant or water-repellent finish.
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Product
LVDS Digital I/O with Kintex UltraScale FPGA - XMC
Model 71810
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- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Supports Xilinx Kintex Ultrascale FPGAs- Front panel digital I/O can be used as a status and control or data interface- PCI Express (Gen. 1, 2 & 3) interface up to x8- VITA 42.0 XMC compatible with switched fabric interfaces- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized and conduction-cooled versions available
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Product
Wrinkle Recovery Tester
TF112 AATCC
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TESTEX Testing Equipment Systems Ltd.
AATCC Wrinkle Recovery Tester is used for determining a fabric's ability to recoverafter wrinkling under a pre-determined load for a set period of time.Provided with a set of 5x3 dimensional plastic replicas to grade fabrics 1-5.
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Product
Services
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We provide the following systemintegration services: Project design and management, Submittal preparation, AutoCad drawings, Panel design, Panel fabrication, HMI Design, System start-up or commissioning, Maintenance, Troubleshooting
