Defect
other than specified, imperfection .
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Product
Analysis
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External appearance due to non-destructive semiconductor · X-ray fluoroscopic observation, SAT observation, electrical operation confirmation, ESD fracture analysis, plastic opening observation of Chip, search for abnormal portions by EMS / OBIRCH, package (PKG) analysis, Please do not hesitate to contact us anything related to semiconductor analysis, such as observation by polishing / parallel polishing (ball and bump observation etc.), peeling observation of defective part, analysis of foreign matter by EDX · FT - IR etc.
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Product
Power Capacitor
POLB HD 7%
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Lifasa - International Capacitors, SA
They are self-regenerating condensers with low loss polypropylene dielectric, filled with N2 inert gas mainly, or with resin, and with overpressure disconnection system, which offers a high level of safety against defects, when cutting the 3 phases in case of action.
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Product
Thermalyze Extension for Steady State Analysis
Lock-In
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Steady-state thermography is limited to detecting hot spots that heat up a minimum of 100 mK (0.100°C). This may be useful for locating shorts on high-power devices, but is inadequate for detecting low power defects such as semiconductor device leakage current or short circuit with very low or very high resistance. Steady-state thermography also suffers from poor spatial resolution as the heat from localized hot spots diffuses rapidly, blurring the location of the heat source.
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Product
AI ANALYZER
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Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.
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Product
Data Analytics
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KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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Product
Vacuum Inspection
INDEC
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INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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Product
Relay and Protection Testing
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HAOMAI Electric Test Equipment Co., Ltd.
These tests are done to show that protection relays are free from defects during manufacturing process.
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Product
TDR Structural Health Monitoring
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Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
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Product
Eddy Current Testing
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Shanghai Xianda Denshijiki Industry Co.,Ltd
And the eddy current generated on the specimen by the specimen by the action of the magnetic field can not be detected (defect) and the change due to the influence of the material is detected.
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Product
Isolation Tester UIP
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The devices of the UIP (Union Isolations Prüfer) isolation tester series are used to test the pore-free condition of corrosion protection coatings of pipes, vessels or plant system parts. The battery-powered device generates test voltages between 5 kV and 30 kV, which are applied to the grounded test object via test electrodes. The location of a defect is signalized by a spark-over with an additional audible warning.
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Product
Vison Inspection System
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High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Product
19" 1He PCIe To PCIe Erweiterung With 4 PCIe X8 Gen-2 Slots
ExpressBox4-1U-xG2, EB4-1U-EXT
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The PCIe Expansion ExpressBox4 1U-x8G2 provides a cost-effective path to expand your available number of PCI Express slots while maintaining a consistent server configuration. Magma products provide increased I /O capacity and scalability because multiple expansion systems can be combined to provide an almost unlimited number of PCI Express slots to a single computer. The ExpressBox4 is the only expansion solution that provides four full-length PCI Express slots in 1U rack-mount form factor. The enclosure includes a hot-swappable redundant power supply and hot-swappable cooling fans. The PCI Express slots are hot-swappable allowing you to replace a defective card without shutting down the system.
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Product
Transistor-Level Defect Simulator
Tessent DefectSim
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Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.
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Product
Contour Check Shape
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Contour Check Shape has proven itself in hot rolling of long products and is an essential part of the rolling process in many factories. It checks hot and cold steel profiles with the help of three-dimensional surface reconstruction. Thus, it records geometrical errors due to rolling defects including surface defects like scale seams, shells or roller outbreaks.
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Product
NUV-PL SiC Defect Inspection System
VS6845E
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Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Non-destructive Eddy Current Testing of Long Products such as Tubes, Rods, Wire, and Profiles
DEFECTOMAT® Product Familiy
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Foerster Instruments, Incorporated
The DEFECTOMAT systems by FOERSTER were specially developed for quality testing and process monitoring of long products. From hot testing to all bright steel processing steps, the surfaces of semi-finished products made from austenitic, (non) ferromagnetic metals can be tested for defects. The DEFECTOMAT systems operate in a contactless and non-destructive manner in accordance with the eddy current method and are used for detecting short defects, such as holes or localized defects and transverse defects. The systems detect defective materials fully automatically and reliably. Defects can be marked, classified, and automatically discarded. the test speed of up to 150 m/s facilitates 100% testing, even at high production speeds. The systems benefit from low operating costs and frugal energy consumption as well as low maintenance costs, few wear parts, and low use of materials.
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Product
3D Sensors (Main Screen)
surfaceCONTROL
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surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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Product
MASK DR-SEM
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Our defect review SEM tools perform detailed reviews of minute defects on photomasks.
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Product
Voltage Detector
PocketDetect LR
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Hachmann Innovative Elektronik
With a PocketDetect LR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working.
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Product
Rotational Metrology System
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The ZeroTouch® Rotational Metrology System is a precise, high-speed, in-line or near-line metrology, and inspection system that measures critical dimensions of rotors, stators, brake discs, and other cylindrical parts, providing manufacturers with real-time metrology, and inspection data to optimize production processes, detect defects, and improve ROI.
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Product
Ultrasonic Imaging System
USPC 3010
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Detects internal defects in new materials and metals. The wide frequency range up to 35 MHz enables highestresolution. A-, C-, and D-scans can be recorded. The imaging in B-scans is an option.
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Product
Solar EL Defect Detector
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Jiangsu Keyland Laser Technology Co., Ltd.
Features: - Reveals invisible defects- Improves line yield prior to lamination- Improves quality and reliability of final product- Exceptional optical resolution in its class- Flexible system configuration for framed or unframed modules testing
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Wafer Inspection System
INSPECTRA® Series
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INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Product
Surge Tester
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They are designed to detect quality defects in the insulation between winding turns, ensuring the reliability and performance of electrical components.
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Product
Single, Double Power Cord Tester
LX-30A+
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Shenzhen Lian Xin Technology Co., Ltd.
Meet UL, VDE, CSA, SAA, T-MARK, KS. IRAM, CCC and other countries’ standards .．·used to test single – ends ,double –ends ,three-ends power supply cords.．·Auto and continuous test in COND,Insulation Resistance ,Leakage Current, Line-to-line Hi-pot(inside HV), Leaking copper(outside HV), relative length,．·Auto test the fine and detective goods, tested qualified ones can be be ejected by ejector pin and marked , automatic cutting defective products， and alarmed with voice prompt and light,
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Product
High-precision Surface Inspection for Wind Turbine Blades
waveCHECK™
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8tree's waveCHECK is a handheld-portable 3D-inspection tool for inspecting wind turbine blades in manufacturing and operation. Its efficient detection of surface defects and instant visual feedback revolutionize surface inspection.It can detect wrinkles, steps, gaps, rain erosion and any other surface damage.
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Product
TEST SOCKET
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IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Product
Flaw Detectors
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Flaw detectors are essential for ensuring the safety and quality of industrial products. They accurately identify defects such as cracks, voids, and inclusions without damaging the materials. Ultrasonic testing is particularly notable for its precision and versatility among the various non-destructive testing methods.
