Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Arbitrary Function Generator
HMF2525/HMF2550
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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4K Multi-Camera System (TRICAM)
E-CAM130_TRICUTX2
e-CAM130_TRICUTX2 (TRICamera) is a multiple camera solution for NVIDIA® Jetson TX2 developer kit that consists of three 13 MP 4-Lane MIPI CSI-2 camera board and an base board to interface with the J22 connector on the Jetson TX2. Each camera is based on the camera module e-CAM137_CUMI1335_MOD, 1/3.2" AR1335 color CMOS image sensor from ON Semiconductor® and integrated high performance Image Signal Processor (ISP).
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PXI Switched Guard Reed Relay Module, 13x SPST
40-121-002
The 40-121-002 provides 13x SPST switches in a single slot PXI module and designed to provide an isolation resistance in excess of 1013Ω. It has been designed to ensure high isolation resistance through the use of switched guards, making it ideal for low level measurements and semiconductor test.
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FT-IR and FT-NIR Analyzers
ABB capabilities encompass one of the largest portfolios in the world for laboratory, at-line and process FT-IR/FT-NIR analyzers. Founded in 1973, ABB Analytical Measurements (formerly Bomem Inc) designs, manufactures and markets high-performance, affordable FT-IR / FT-NIR spectrometers as well as turnkey analytical solutions for Petroleum, Chemical, Life Sciences, Semiconductor, Academic, Metallurgy, OEM industries and spectroradiometers for Remote Sensing/Aerospace market.
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High-Standard Bench-Top Laser Source
Shanghai Stone Communication tech Co., Ltd
These bench-top laser source has built-in high-feature Semi-conductor laser device, it is the SM output, with less than 10MHz plus width. Based on the advanced micro-processor control system, this instrument integrated high precision ATC and ACC(APC) to control the electric circuit, in order to realize the high stable output of the laser device, and make the operation easily and directly. We also can provide user required communication port with the software to realize remote control from the PC.
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Semiconductor Switching Systems
Keithley 700 Series
The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Specialty Sources
When conventional sources hit their limits, specialty sources step in. These custom-designed plasma and vapor sources are engineered for III-V MBE and compound semiconductor applications where unique material delivery and control are critical.
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Defect Inspection Systems
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Meters For Contact Angle And Surface Tension
SURFTENS HL
Optik Elektronik Gerätetechnik GmbH
Measuring instrument for contact angle and surface free energy, special solution for semiconductor technology for wafers up to 300 mm.
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WDXRF Wafer Analyzer
2830 ZT
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Advanced Metrology System
AMS Series
Precision systems for accurate measurement and quality control in semiconductor manufacturing.
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Highest Demanding Finishing Processes
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.
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CMP
CMPs remove unevenness on wafer surfaces that occur during the production process. Applications are growing due to the increase of layers in semiconductor devices and the growing variety of wiring materials.
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Moisture Analyzer
5800
The 5800 is ideal for high-purity gas production, semiconductor gases, and the production, storage and transmission of olefins. It is suitable for use in industries including hydrocarbon processing, industrial gas and semiconductors.
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USHIO Infrared Laser Diodes (705nm - 852nm)
The Optoelectronics Company Ltd
USHIO OPTO's new 705nm, 40mW laser diodes, HL7001MG and HL7002MG are the first ever 705nm semiconductor lasers and are suitable for biomedical light sources. For more information, see HL7001MG/7002MG overview.
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Jetting System
IntelliJet®
The IntelliJet® Jetting System with patented ReadiSet® Jet Cartridge delivers cutting-edge reliability and micro dot dispensing for manufacturing advanced semiconductor and mobile electronics packages
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E-Chuck Supplies
Advanced Energy's Trek e-chuck supplies have been a staple in the semiconductor industry for decades. They allow you to improve throughput, virtually eliminate sticky wafer and wafer popping issues, and reduce backside gas errors.
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Thin Film Composition and Thickness Monitor
P-1000
The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
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TFProbe Wafer Measurement Tools
Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.
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Wire/Cable Harness Tester
PANTHER 4HT
Qmax Test Technologies Pvt. Ltd.
The Panther 4HT Wire \ Cable Harness tester is designed for Automotive and Semiconductor industry to apply in testing of wire harnesses, that needs testing during production with whole new fleet of features that make the task reliable, complete and fast. It uses innovative technology to test the impedance values. It can be interfaced to any type of fixtures as required. It uses the Learn and Compare technique for finding out opens or shorts in a harness. The learnt open / short combination from a Good Board is taken as reference and compared with the Board Under Test for any mismatch.
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STPOWER RF DMOS Transistors
ST offers a broad portfolio of RF DMOS (double-diffused metal oxide semiconductor) transistors operating from a supply voltage ranging from 50 up to 100 V with high reliability (1 million power cycles). Targeting applications in the 1 to 250 MHz frequency range, our RF DMOS transistors feature high peak power (up to 1.2 kW) and high ruggedness capability (infinite:1 VSWR).
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CiCi-Raman-NIR Spectrometer
HORIBA Scientific is the world leader in Raman spectroscopy, with a long history in the technique. HORIBA OEM has pioneered Raman systems for spectroscopy, designing and manufacturing them for over four decades. We provide miniature spectrometers and systems for industrial applications such as process control, security, pharmaceutical, medical and semiconductor. The CiCi-Raman-785 is our high performance spectrometer featuring an aberration-corrected concave holographic grating configured with Horiba Scientific's Syncerity™ TE-cooled CCD camera with a VIS-NIR 2048 x 70 detector, in a TE-cooled Head at -50° C.
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Dicing And Lapping Systems
In semiconductor fabrication, clean die separation and smooth surfaces can make all the difference. While these steps might come late in the process, they play a major role in how well a device ultimately performs. Dicing and lapping bring the necessary level of precision to cut wafers into individual dies and polish surfaces so everything fits, functions and holds up the way it should in real world scenarios.
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Copper Diffusion TestSystems
Materials Development Corporation
MDC announces the addition of software and hardware for copper diffusion studies to its CSM/Win suite of semiconductor test systems and software. This new CSM/Win feature plays an important part in the development of processes and materials for the next advance in integrated circuit technology that employscopper as a conductor. Special Current-Voltage Bias-Temperature Stress (IV-BTS) software can measure the degradation of insulator quality due to copper diffusion.Multiple test sites can be stressed with a constant voltage while the current through each site is measured and recorded. The Current-Voltage Bias-Temperature Stress test supplements conventional MOS C-V measurements and Triangular Voltage Measurements (TVS) that are also employed in copper diffusion studies.
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Femtosecond Terahertz Spectrometer
Pacifica
Terahertz spectroscopy and microscopy are becoming a powerful tool in biology, medicine, semiconductor physics and in many applicaitons. Designed for obtaining THz spectra by using of THz pulses generated by femtosecond laser in oriented ZnTe crystal.
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Vison Inspection System
High Speed stroboscopic 2D vision inspection system for die attached and wirebond quality in back-end semiconductor processes. User friendly HMI for easy recipe creation and management. Able to configure with various defect identification module. (Strip Mapping, Inker, Scriber, Pucher, Bristle, Laser wire cutter and Laser clip bonding cutter.)
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Laser Turbidity Meter
HU-200TB-EH
HU-200TB-EH is a laser-type turbidity meter that can measure turbidity of membrane filtered water, etc. with a resolution of 0.0001 degrees. A high-sensitivity turbidty meter with a minimum resolution of 0.0001 degrees at a measurement range of 0.0000 to 2.0000 degrees, which uses a long-lasting semiconductor laser as the light source and employs a transmission 90-degree scattering light method.This is best suited for sensitive measurement of turbidity on surface water.
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Electronic Components
We supply a wide range of components and materials to the electronics industry, such as: integrated circuits for personal computers, semiconductor materials for system LSI, optical communication materials for telecommunications, components for display devices seen in smartphones and projectors, and materials used in solar cells and lithium batteries.
