Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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FluorOptic Fiber Optic Temperature Sensors
Advanced Energy’s Luxtron® Fiber Optic Temperature Sensors enable customer innovation in complex applications for a wide range of industries including semiconductor equipment, industrial, manufacturing, telecommunications, data center computing, and medical. Based on Fluoroptic® technology, each individual product can be configured for specific applications.
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Semiconductor Test Equipment
IC Tester
Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
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Semiconductor Test
Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Fiber Optic Type Chemical Concentration Monitor
CS-600F
The CS-600F achieves a higher level of functionality best suited for manufacturing, such as the ability to perform in-line measurement of high temperature chemical solutions in various applications, stable operation for reduced downtime, and compact size for improved space productivity in order to meet the precise chemical solution concentration management required in leading-edge semiconductor wet process.
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Trusted Semiconductor Die/Wafer Source
To offer a complete Turn-Key Solution requires the ability to source both leading edge high density and older die/wafer products. DPACI has factory direct access to Static Ram, Flash and DRAM Die/Wafer. For obsolete parts, DPACI can assist you with sourcing or recommend an upgrade. DPACI has access to roadmaps, data sheets and die maps to assist you with your choices.
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RF & Microwave Signal Generator
SMA100B
The R&S®SMA100B RF and microwave signal generator delivers uncompromising maximum performance. It provides the purest output signals while maintaining the highest output power levels with the lowest harmonics, far outpacing the competition. As the world's leading signal generator, it can handle the most demanding module and system T&M tasks in the RF semiconductor, wireless communications, aerospace and defense industries.
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Programmable Parametic Tester
IST 878
IST Information Scan Technology, Inc.
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit testing for a wide range of discrete semiconductors
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Automated Discrete Semiconductor Tester (ATE)
5300HX
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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On-Wafer Measurements
Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Magnetic & Current Sensors
From the International Space Station to a simple electronic compass, we can provide a solution to meet your magnetic semiconductor needs. The F.W. Bell® product line was founded in 1944. Since then we have been a pioneer in developing instrumentation to measure electric current and magnetic fields.
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Materials Metrology
VeraFlex Family
World-class XPS and XRF metrology technologies for semiconductor process control.
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Super high temperature hall effect measurement system
Super high temperature hall effect measurement system that is useful to flow gas into chamber with sample. - Newly developed furnace that makes it possible to increase over 800 and use for measuring hall effect. - Gas flow control system in order to flow various gas. - Sample holder for high temperature. (keep the good contact on 800) - High Temperature control system (DC power) On condition of specific temperature with gas flow , new semiconductor materials have been developed to see electrical property's change.
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4K Autofocus MIPI NVIDIA® Jetson TX2 Camera Board
E-CAM132_TX2
e-CAM132_TX2 - 13MP Autofocus Jetson TX2 camera board is a 4-lane MIPI CSI-2 camera solution for NVIDIA® Jetson TX2 developer kit. This camera is based on 1/3.2" AR1335 CMOS image sensor with advanced 1.1µm pixel BSI technology from ON Semiconductor® and an integrated high-performance image signal processor (ISP) that performs all the Auto functions (Auto White Balance, Auto Exposure control). e-CAM132_TX2 is a two board solution consists of a base board and a 13MP autofocus camera board. This camera board is connected to the base board using 30 cm micro-coaxial cable.
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High-resolution, SWIR megapixel camera
Wildcat+ 1280 Series
The Wildcat+ 1280 series is based upon a state-of-the-art InGaAs photodiode array with 1280×1024 pixels and 5 μm pixel pitch. The camera offers superior, high-resolution SWIR imaging capabilities, comes in a versatile and industry-proven Wildcat camera package (GenICam compliant) and offers advanced on-board image processing.The Wildcat+ 1280 camera outputs full frame images at 120 Hz via either a CameraLink or USB3 Vision interface.The Wildcat+ 1280 is suitable for semiconductor inspection, display inspection (mobile phone and TV), microscopy and laser beam analysis.Benefits & Features• Compact and industry-proven camera design• High-resolution SWIR imaging• Advanced on-board image processing performance• GenlCam compliant• Flexible optical mount and lens options
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Wafer Auto Line Integration
The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Semiconductor Packaging System
Inspects the quality of finished cells by measuring the gap between the battery electrode laminate and aluminum can.
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Test Service Offerings
ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Generators and Sources
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Semiconductor
DieMark
DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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PXI 12 Channel High Voltage Multiplexer
40-320-001
The 40-310/320 Range of High Voltage Switching Modules will hot switch up to 750V peak and cold switch up to 1000V peak in either general purpose relay (40-310) or multiplexer (40-320) configurations. These modules contain high-quality reed relays with switching ratings comfortably higher than the 40-310/320 specification. Applications for the 40-310/320 series modules include; circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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ICP OES spectrometer (ICP AES)
SPECTRO Analytical Instruments GmbH
ICP OES spectrometer (ICP AES) for the rapid analysis of elements in a variety of matrices including aqueous, semi-conductor, petrochemical, soil, metallurgical and slurries
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Semiconductor Laser
·Fibre coupling semiconductor laser·The product range of wavelengths is 450nm~1550nm ·The product range of power is 2mW~300W ·A Variety of package coupling form,can be integrated indicator light,a photoelectric detector, a semmiconductor refrigerator,optical switch function·Solution of flexible and diverse,providing customized service sub system
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0.1 Micron Portable Particle Counter
3950
This revolutionary 0.1-0.3 micron 2-channel semiconductor particle counter comes in one of the lightest form-factors available today; clocking in at only 7.5lbs (3.4kg). It is designed for high-end contamination control environments, such as semiconductor manufacturing facilities and cleanrooms, and can be used for standalone operation or integrated into an existing monitoring system to accommodate a vast array of applications.
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Software Development Projects
Precision Development Consulting Inc
Automation of new process tool prototype in startup environment, Complex R&D Gasbox Automation, Semiconductor System Control Software, Wafer Transfer Control Software, 300mm Factory Automation, Complete port of Spectrometer software to windows, HSMS Protocol
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Leak Detectors
In various market segments from the automotive industry to refrigeration and air conditioning technology to the manufacture of semiconductor components and solar technology our leak detectors provide the highest quality and increased process safety. With an INFICON leak detector, the time and money required for maintenance and troubleshooting of your products will be reduced to a minimum and your ongoing operating costs will be significantly less. An INFICON leak detector, for example, is so highly sensitive that a release of less than one millionth of a gram of gas can be shown to be a leak.
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Semiconductor
Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.
