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Test Point Terminals
Zierick Manufacturing Corporation
Zierick PCB test point terminals offer exceptional designed-in flexibility, allowing test engineers to easily attach J hooks, EZ hooks, lead grabbers, clips and other test probes.All Zierick test point terminals are available with stress-free Accu-Lok mounting for a reliable PCB interconnection.
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Flying Probe Tester Substrate
Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions forscanningcapacitance measurementhigh accuracy and temperature Management
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TestStation ICT
The TestStation is Teradyne’s flagship in-circuit test system optimized for complex, highly integrated boards and features award-winning SafeTest protection technologies. The TestStation has a test point range of 256 to 3,840 pins.
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Robotic Probing of Circuit Cards
System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Passive Oscilloscope Probes
5900 SERIES
Probe Master's new 5900 series passive oscilloscope probes are available in 400 MHz & 500 MHz bandwidths. Probes are also available with readout actuators for oscilloscopes with the readout feature. The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.The probe body is made of high impact ABS. Soft molded strain reliefs at all stress points assure long cable life. In short it has been designed to offer you high performance coupled with high quality.
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Reference Thermometers
Our Reference Thermapen takes lab accuracy into the field. Each unit is factory calibrated at 5 test points and includes a UKAS accredited calibration certificate with test data. A true "system calibration" is performed matching its Platinum RTD sensor and the built-in electronics so all errors are included in the spec.
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Fixture and Software for Open/Leak Inspection
In addition to jigs and fixtures for probing conductors and electrode pads, NIDEC-READ provides specialized software for test point selection and log analysis.
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LCR Meter
TH2817C+
Changzhou Tonghui Electronic Co., Ltd.
■ Freq: 50Hz-100kHz, 10 frequency points ■ Test Accuracy: 0.1% ■ Test Speed: Max.19ms, support low frequency and high speed: TX4+3ms
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PXI Based Multifunction Measurement and ICT Instrument
PXI-501
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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Cutting-Edge Quick-test Adapters, Valves & Fittings
Ralston Instruments is world’s leading provider of advanced calibration applications, meticulously engineered to save time and ensure seamless pressure testing, repair and maintenance operations. We offer a complete suite of fully integrated Quick-test adapters, valves & fittings. The products are intelligently designed to offer time-saving and secure connections to practically any device. The test point adapters, valves & fittings are highly functional for a range of pressure calibration and other applications.
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Dedicated Testers
Dedicated Testers are often inexpensive due to their low test point requirements, which allow for a reduction in switch cards, especially when compared with a Universal Tester. Ease of setup is accomplished through the utilization of transfer connectors between the fixture and the machine. However, this can contribute to a higher fixture cost than typically seen with a Universal Test Fixture due to the nature of their construction which is labor intensive.
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CAM/GATE Test Kits
Series 45
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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TRUE Z-AXIS CAM ACTIVATED TEST FIXTURE KITS
The Cam Press is designed to provide precise, bed-of-nails contact, in a production test environment. Durable aluminum and steel construction and precision bearings insure accuracy and repeatability sufficient to contact test points as close as 10-mils center-to-center.
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Pressure Test Points
Minimess
Minimess test points offer a uniquely simple method of accessing low or high pressure systems for the purpose of pressure testing, oil sampling or gas charging. Developed by Hydrotechnik more than 50 years ago, they are found worldwide in hydraulic, process and gas systems. These pressure test points offer the most advanced sealing system available with working pressures up to 630 bar.
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JTAGulator 24-Channel Hardware Hacking Tool
32115
On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
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PC Controlled High Voltage Tester
Cablescan H8
The Cablescan H8 provide the PC-based power of the larger PC based testers, but in an economical package for users who do not require more than 512 test points. This analyzer is designed to operate under the control of your PC.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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OTP-Based Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Programmable Hi-Pot Tester
DU331/332/333
Delta United Instrument Co., Ltd.
Large LCD Display Window for Setups and Test Values Output Frequency 50/60 HZ SelectableAll Initial Default Function Setting scan be Changed Easily to Fit RequirementEasy Manual Driven with Cursor Guiding Operation Mode Battery Backup Function will Recall theTest Parameter Settings before Power offLarge Memory (100 sets) for Setup Steps & ParametersEach Memory offers 9 steps of different Test ParametersTest mode: Single Step, Multiple Steps (Step by Step), Test Circle Number or Continuous Test are Programmable DU333 is designed for Multi-point Scan Test DU331/DU332 can perform Multi - point Test when used with Scan Box DU330
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Design for Test Service
Design For Test (DFT) is a technique used to implement certain testability features into a product. Testing House can provide an analysis of the CAD data for testability of your circuit board. Access to a board can be very difficult as boards get smaller and designs get more densely populated. We can work with your design engineer to improve testability and maintain an effective in-circuit test. When access to the board is limited and boundary scan devices are present, we can provide the customer a list of key nodes that will require access in order to provide a very effective test. Our analysis will provide a list of all the accessible test points and an explanation for any nodes declared inaccessible.
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15 Pin Breakout Interface
VSI-Breakout-15
The VSI-Breakout-15 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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ABex Matrix Module with 172x4 or 86x8 Cross Points
ABex AM-301 Matrix
The ABex AM-301 is a 172×4 matrix designed as a universal connection between the test points and the measuring instrument. This can be done locally or via the ABex. The ABex AM-301 can be configured as a matrix with 4 or 8 busses. The internal matrix busses can be switched to the analog bus.
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Test Points, Tips, Probes, Jumpers and Clips
Nickel Plated Steel Alligator Clips. PTFE Insulated Terminals and Test Point Jacks. Circuit Board Test Jacks and Plugs. Color Coded PCB Mount Test Points, Loop Style with Plastic Base for Snap-In Mounting. Surface Mount Test Points on Tape and Reel.
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Thermal/Multi-Function Data Logger
51101
Chroma Systems Solutions, Inc.
Models with 1, 8, and 64 channels on-line data recording. Multi-sets linked to a PC for hundreds of channels are doableSupports B, E, J, K, N, R, S, and T type thermal couples with ITS-90 defined temperature rangeIndividual channel cold junction compensation withTemperature resolution up to 0.01℃, error down to (0.01% of reading+0.3℃)Voltage full range ±480VDC, ±10VDC; resolution 1mV, 10uV; error down to (0.1% of reading+1mV), (0.015% of reading+100uV)1000VDC channel to channel isolation, full protection for testing points with charge and guarantee for accurate measurementsThermal couple open circuit detectionPC-based operation with powerful software for recording and analyzing data1 and 8 channel models are USB powered. No battery or external power supply is required
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100 Pin Breakout Interface
VSI-Breakout-100
The VSI-Breakout-100 is a very useful tool in debugging signals or software in a system. It allows unlimited access to signals within the cabling that might otherwise be difficult to access. The board gives test points at each side of the connector and jumper with a easy to use tabbed shunt to allow for easy disconnection of any particular signal between the connectors. The jumpers also give an opportunity to inject a signal regardless of what signal was originally being driven.
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Touch Screen Mini SM OTDR 1550nm
TR1300S
Shenzhen Sharingtek Communication Co., LTD
The TR1300S mini OTDR is compact and easy to carry. It adopts a 3.5 inches high-definition touch screen, supports multi-touch and smooth operation, integrates OTDR, optical power meter, light source and visual fault locator in one unit, to meet various test needs in different occasions. The OTDR function adopts 1550nm wavelength and is built in high-efficiency wavelength isolator. It can perform optical live test on 1490 and 1577nm optical links, which supports up to about ±10dB optical live test. Its maximum measurement range is 60km.The TR1300S is used to measure optical fiber’s length, loss, connection quality and other parameters. It can easily test the breaking point, bend and loss point of the optical fiber links. It is suitable for maintenance personnel to have optical line maintenance and emergency repair testing.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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Passive Fiber Network TAPs
Passive network test access points (TAPs) are a hardware tool that allows you to monitor your network. Garland Technology offers fiber network TAPs in network speeds of 1Gb, 10Gb, 40Gb and 100Gb. Fiber Network TAPs are passive, purpose-built hardware devices that make a 100% copy of your networks data - without affecting network traffic. Passive network TAPs let your monitoring tools to see every bit, byte and packet®.
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Multipurpose Debug Board For EC
DB30 x86 Debug Module
The DB30 x86 Debug Card is designed for debugging of COM Express modules with FFC (FlexFoil Cable) debug connector. It includes an 80 port for Power on and Self-test (POST) via I2C interface, interface to SPI Flash for BIOS update, interface to EC for Embedded Controller (EC) update, Power and Reset buttons, and Status LEDs and Test Point for various debug tests.
