Test Fixtures
UUT interconnect interchangeable with tester.
See Also: Fixtures, Mechanical Fixtures, Vacuum Fixtures, ATE Fixtures, PCB Test Fixtures, Board Test Fixtures, Bed of Nails, Spring Probes, Test Jigs, Test Probes
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Bottom Electrode SMD Test Fixture
16198A
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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System Test Fixture
Chassis Level Test Fixture, Set Box Test Fixture, and more by IST Engineering
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Test Probes
Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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In-Circuit Test Fixture Design Services
XJTAG offers consultancy services to design and build production test fixtures that integrate JTAG boundary scan with bed-of-nails testing.
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PCIe
M.2 Gen4 Socket2
SCHILLER AUTOMATION GmbH & Co. KG
The PCIe Gen4 M.2 Socket 2 test adapter or test fixture kit facilitates Device and Host compliance testing for PCIe Gen4 M.2 Socket 2 Source and Sink devices.
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SATA
SCHILLER AUTOMATION GmbH & Co. KG
SATA test adapters and test fixture kits facilitate Source and Sink compliance testing.
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Manual Test Fixture (MA)
MA 2013/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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USB-C® Tx & Long Chnnel Rx Precet. Test Fixture
AUT20044 Rev:B0
The original Intel USB-C 3.1 Tx Test Fixtures includes two types of fixtures, UFP and DPF. Allion Pre-Cert Test Fixture integrates functions of the two fixtures into an one-board solution, eliminating the hassel to frequent switching of two fixtures.
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In-Circuit Test Fixtures
Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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High Node Count In-Circuit Test Fixtures
HNC Test Fixture
Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.
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dmXLAN Software
This software can be used to configure all the ELC Nodes and Switches, as well as to monitor the dmXLAN network. Use it also to control and test lighting fixtures connected to the dmXLAN network, independent of the brand of consoles and lighting fixtures used.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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PXI 8x9 RF Matrix 250MHz 75 SMB
40-725-721
The 40-725 is an 8x9 RF Matrix Module suitable for switching frequencies up to 500MHz (50Ω version). The 40-725 is available in either 50Ω or 75Ω versions with SMB coaxial connectors. It is intended for the easy construction of high performance bidirectional matrix switching systems. Automatic Isolation Switches are located on all coaxial connections, these disconnect the matrix from the external test fixture maximizing isolation and RF performance.
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Radar Altimieter Test Panel for ALT-50/55
TA-55
Radar altimeter panel designed after the ALT-50A test fixture. (Ref. Fig. 5-1). Panel allows testing of the indicator or R/T independently or together. An internal power supply is provided to support stand alone testing of the indicator. This panel contains a 4 digit DVM and comes with enclosure. This panel will allow by the book testing.
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Adjustable Press Plate Bed of Nails Testers
Rand Adjustable Family
esigned for Research & Development and Pre-Production environments to support often reoccurring product design changes. The primary design focus for this fixture is ease in applying engineering changes and resilience to the abuse of applying multiple engineering changes without damage. In R&D and Preproduction, design changes and updates can occur every week. This Rand fixture, unlike normal test fixtures was designed to be easily taken apart and updated. Constantly disassembling modifying and reassembling a normal bed of nails test fixture over and over again can be a major disaster with wire breakage and test pin bending issues. The modular design of the Rand fixture allows for easy disassembly without flexing the wires or risk of bending test pins. The Rand fixture provides complete easy access for multiple updates requiring machining, drilling and wiring changes.
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Stand-Alone Test Fixture
MA 2012/D/H/VPC-G12x-18
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,50 kg
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PXI 12x8 RF Matrix 250MHz 75 SMB - With Loop-Thru
40-726A-751-L
The 40-726A is a 12x8 RF Matrix Module suitable for switching frequencies up to 300MHz (50Ω version). The 40-726A is available in either 50Ω or 75Ω versions with a choice of coaxial connectors. The module is designed to provide a simple and scalable bidirectional matrix for RF frequencies. Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximizes isolation and RF performance.
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/15
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,46 kg
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Wireless In-Circuit Test Fixtures
Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
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Clamshell Type Mechanical Fixtures
Series 31
The GR Series 31 dual well mechanical kits provide a solution to printed circuit board testing that requires the benefits of GR2270 style (VG) interface compatibility and the advantage of testing two devices on the same test fixture. These can be similar devices, or devices that are used together in a functional test.
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Air Data Adapter Test Panel
TA-241
AZ-241 Adapter Panel is designed to meet manufacturer's requirements. This panel will allow by the book testing of the air data computer when interfaced with the main air data test fixture. The Scott-T transformer is optional or can be customer supplied. Without the Scott-T your API can read the altimeter resolver directly.
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Serial Distance Display
TA903-03
This panel mounted or portable display will read Bendix/King serial distance as generated by their DME systems or GPS products. This long standing three wire format of CLK, DATA and REQ can now easily be displayed without the expense of a KTS143 test fixture. This product is ideal for shop and aircraft troubleshooting. The extruded aluminum enclosure is a standard DIN size(1/8) and the unit interfaces through a 25 pin D connector.
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LCR Meter
SS10X Series
LCR Meters are basic passive component testing equipment, can be used in quality management department or production process for quality inspection. Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, electric valve, contactor, cable, wire, etc. This series LCR meter, offering different kind of testing fixtures, can improve testing precision and reduce the difference value of error code, being an economical and useful basic testing instrument.
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Cryogenic Millimeter-Wave / Microwave Test Fixtures and Calibration Kits
upj10
KEYCOM''s cryogenic millimeter-wave / microwave test fixtures and calibration kits are specifically optimized for testing the performance of patterns between the edges of printed boards(edge type) and circuit testing on the printed boards(probe type). They are also designed to minimize heat capacity by miniaturizing their dimensions so they cool off efficiently, and materials with low coefficient of linear thermal expansion such as invar are used for major parts where high dimensional stability is required. Their operating frequency ranges from DC to 110GHz.
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Aircraft Test Set
CA-2100S-07
The CA-2100S-07 is a bench mounted, modularized and computer based test set used to service all types of aircraft electronics. It simulates the aircraft environment and replaces a myriad of specialized test fixtures found in the industry.
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Safety Compliance Test System
EN 60601
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Low Noise Test Cables For N1413 With B2980 Series, 3m
N1427B
The N1427B is designed to operate specifically with the B2985B/87B Electrometer/High Resistance Meter. It comes with a separate triaxial (special screw-type) female connector and a High Voltage BNC (special type) female connector. This allows terminal configuration to be converted to any other configuration. Therefore, custom test fixture can easily be constructed. The N1413A High Resistance Meter Fixture Adapter is required to connect the N1427B to the B2985B/87B.
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(ITA), Breakout Box & Fixtures
WinSoft provides a wide range of Interface Test Adapters (ITA) and test fixtures to meet the most challenging functional test and signal conditioning requirements. This includes high frequencies, voltages and current.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
