Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Product
Mechanical Coating Thickness Gauges
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Mechanical Coating Thickness Gauges are suitable for working in high risk areas such as high temperature or flammable atmospheres, underwater or where the risk of explosion is high and could be triggered by the use of an electronic instrument. From the simplest coating thickness gauge Elcometer 101 which will provide you with quick and immediate results to the more accurate coating thickness gauge Elcometer 211, also called the "banana gauge" which is ideal for cold and underwater surfaces.
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Product
Batch Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Batch Wafer Transfer Tools
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Product
Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
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Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
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Product
Wafer Inspection System
AutoWafer Pro™
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AutoWafer pro is our most advanced ultrasonic equipment for detecting defects in bonded wafers in a production environment, providing fast, high-resolution scanning of 200mm and 300mm bonded wafers.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Multi-mode Ultrasonic Thickness Gauge
MMX-6DL
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The MMX-6DL has all the features of the MMX-6 plus: An Internal data logger that stores a total of 1000 readings in 10 files of 100 readings each file. This gives the user the ability to store, and download the stored measurements directly to a PC using our DakView software program. The software and transfer cable are included in the MMX-6DL kit.
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Automotive Paint Thickness Meters
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Linshang automotive paint meter, also named paint thickness meter, is a painting thickness gauge used to test car paint thickness. Linshang automotive paint meter can identify the substrate automatically. If you devote to find a cost effective paint thickness meter, you can view the digital coating thickness gauges listed below.
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Product
Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10
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The most experienced device in our tactile portfolio – reliably solves all special applications.
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Product
TFProbe Wafer Measurement Tools
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Angstrom Sun Technologies, Inc.
Angstrom Sun Technologies Inc offers optical measurement and inspection systems for semiconductor and related industries. Its core products include wafer measurement systems, spectroscopic ellipsometers, thin film reflectometers, and microspectrophotometers.
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Product
Thickness Tester
CX-Series
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The Thickness Tester - CX-1000 combines our patented capacitance sensor with industry-leading software to give you plastic film thickness profiling resolution to one micron. This gauge can be run as a stand-alone bench unit, or can be connected to a computer for RS-232 operation by our Thickness Tester - CX-1100 Quality Control Software. Capacitance measurement is industry-recognized as the best choice for off-line, high resolution, continuous gauge profiling for plastic films.
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Product
Material Thickness Meters
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Choose from a variety of material thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable material thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.A material thickness meter is an essential quality assurance tool when anodizing, galvanizing and applying zinc coating to metallic surfaces. A material thickness meter also is used to measure body paint thickness and uniformity on pre-owned cars, revealing repainted spots, identifying hidden damages and exposing undisclosed accidents. This information is important when determining the actual value of a used car. In addition, certain types of thickness meters can measure wall thickness and determine the hardness of metals, plastics and glass.
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Product
Wafer Auto Line Integration
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The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Product
ATEX Certified Ultrasonic Thickness Gauge
Cygnus 1 Ex
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The Cygnus 1 Intrinsically Safe is a rugged, shock-proof multiple echo ultrasonic surface thickness gauge designed for safely measuring metal thickness to determine wastage or corrosion in potentially explosive environments. By using multiple echo technology the metal thickness gauge measurements are error checked using 3 return echoes to provide repeatable, reliable results.
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Product
A-/B-Scan Thickness Gauge For NDT
SONOWALL® 70
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SONOWALL 70 is the first thickness gauge in the market with intelligent probe identification. The extended probe management allows probe-specific information such as DAC-curves, delay lines, and serial numbers to be saved directly in the ultrasonic probe. In addition to various thickness applications, the device can be upgraded to a full-function flaw detector.
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Product
Ultrasonic Wall Thickness Measurement Meters
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The LaserLinc UltraGauge+™ series of ultrasonic meters and gauges measure wall thickness, layer thickness, and concentricity of plastic, rubber, glass, and metal products. Typical applications include tubing, hose, pipe, insulated wire, cable, and certain multi-layer products.
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Product
Ultrasonic Thickness Gauge
TI-100K
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TI-100K inherits high performance of predecessors including popular TI-45NA, and also have memory function and statistical processing performance.
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Product
Flatness, Bow, Warp, Curvature, Glass Thickness
1D-glass Thickness Profile Measuring Instrument GPM2
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Optik Elektronik Gerätetechnik GmbH
Highly accurate automatic measurement of glass thickness distributions. The glass thickness profiler GPM has the function to execute a fast and precise determination of the thickness profile of flat glass samples or another transparent material with a thickness range from 30µm to 700µm (option with sensor type 1) and width to 1200mm. The measuring point distance of the profile measurement can be varied over a micro-step-controlled positioning steering between 0.1mm and 1mm. The measured value accommodation for a scanning point takes place with the help of a special hardware module for image processing algorithms within 40 ms. The entire measuring time for a sample results thus as product from the sample width which has to be measured, the measuring point distance and the measuring time per measuring point.
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Product
Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Ultrasonic Thickness Gauge
SONOWALL® 50
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The SONOWALL 50 features a highly accurate data read out and a large measurement range. An integrated data logger and its user-friendly operation make the device ready for a wide variety of applications. The included software is a convenient tool to store and evaluate the measurements.
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Product
Coating Thickness Gauges
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Non-destructive coating thickness measurement of non-magnetic coatings, e.g. paint, enamel, chrome on steel, and insulating coatings, e.g. paint and anodizing coatings on non-ferrous metals.
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Product
Distance, Coating and Thickness Meters
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PeakTech Prüf- und Messtechnik GmbH
This professional laser distance measuring device with multi-line LCD display, which has a backlight, was specially designed for high-precision distance measurements.
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Product
Wafer Tester
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Tokyo Electronics Trading Co., Ltd.
A vital step in the Semiconductor Value Stream, focusing on electrical screening and consumption of Known Good Die (KGD).
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Surface Thickness Gauges
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The Cygnus range of ultrasonic surface thickness gauges are non-destructive testing (NDT) instruments that enable an accurate metal thickness measurement to be obtained from one side only, without the removal of protective coatings or damage to test materials.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
